Want to know more about the most widely used and best known silicon probe for Atomic Force Microscopy and Scanning Probe Microscopy – the NanoWorld Pointprobe Series? Then you shouldn’t miss this interview with NanoWorld CEO Manfred Detterbeck.
Check out our screencast about NanoWorld Pointprobe® Diamond Coated Tip (DT), Conductive Diamond Coated Tip (CDT).
It will give you an overview of our Diamond Coated Tip (DT) and Conductive Diamond Coated Tip (CDT) which have been developed for applications that require hard contact between probe and sample. Some typical applications are friction force measurements, measurement of the elastic properties of samples, as well as wear measurements or nanostructuring.
Check out our screencast about NanoWorld Pointprobe® High Aspect Ratio (AR5 / AR5T) Tip.
It will give you an overview of our High Aspect Ratio (AR5 / AR5T) tip which has been developed for measurements on samples with sidewall angles approaching 90°, e.g. deep trench measurements or other semiconductor applications.