Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Researchers from the Physics Department at Durham University demonstrate an imaging technique using Atomic Force Microscopy in their JoVE Engineering publication.

For each step, the authors have explained the scientific rationale behind their choices to facilitate the adaptation of the methodology to every user’s specific system.

The NanoWorld Arrow-UHF AFM probe for high speed AFM is also mentioned in this publication.

Ethan J. Miller, William Trewby, Amir Farokh Payam, Luca Piantanida, Clodomiro Cafolla, Kislon  Voïtchovsky, Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid (2016), JoVE, 1940-087X, doi:10.3791/54924

https://www.jove.com/video/54924/sub-nanometer-resolution-imaging-with-amplitude-modulation-atomic

AM-AFM images of hard samples in fluid solutions
AM-AFM images of hard samples in fluid solutions. – figure from Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid Jove.com – please refer to link above for the full article

 

Creative Commons Attribution
https://doi.org/10.3791/54924
Copyright © 2016 Creative Commons Attribution 3.0 License

nano tech 2017 show – Tokyo Big Sight, Japan

nano tech 2017, booth 4s-27. International nanotechnology exhibition & conference
nano tech 2017, booth 4s-27. International nanotechnology exhibition & conference

currently meeting customers at the nano tech 2017, the international nanotechnology exhibition and conference at Tokyo Big Sight, February 15 to February 17, 2017.

See you at booth 4s-27 of Toyo Corporation, our distributor in Japan!

 

Zoom zoom: High speed AFM imaging

The NanoWorld Arrow UHF was mentioned in this blog article on Microscopy and Analysis http://www.microscopy-analysis.com/blog/blog-articles/zoom-zoom-high-speed-afm-imaging

NanoWorld Arrow UHF AFM tip for high speed atomic force microscopy
3D view of NanoWorld Arrow UHF AFM tip for high speed AFM