Researchers from the Physics Department at Durham University demonstrate an imaging technique using Atomic Force Microscopy in their JoVE Engineering publication.
For each step, the authors have explained the scientific rationale behind their choices to facilitate the adaptation of the methodology to every user’s specific system.
Arrow-UHF AFM probe for high speed AFM is also mentioned in this publication.
Ethan J. Miller, William Trewby, Amir Farokh Payam, Luca Piantanida, Clodomiro Cafolla, Kislon Voïtchovsky, Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid (2016), JoVE, 1940-087X, doi:10.3791/54924
AM-AFM images of hard samples in fluid solutions. – figure from Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid Jove.com – please refer to link above for the full article
Creative Commons Attribution
Copyright © 2016 Creative Commons Attribution 3.0 License
nano tech 2017, booth 4s-27. International nanotechnology exhibition & conference
currently meeting customers at the nano tech 2017, the international nanotechnology exhibition and conference at Tokyo Big Sight, February 15 to February 17, 2017.
See you at booth 4s-27 of Toyo Corporation, our distributor in Japan!
NanoWorld Arrow UHF was mentioned in this blog article on Microscopy and Analysis http://www.microscopy-analysis.com/blog/blog-articles/zoom-zoom-high-speed-afm-imaging
3D view of NanoWorld Arrow UHF AFM tip for high speed AFM