Type: Arrow™ UHF
Ultra High Frequency – Reflex coating
|Resonance Frequency||2000 kHz||700 - 2000 kHz|
|Mean Width||42 µm|
|Thickness||0.7 µm||0.5 - 0.9 µm|
Optimized positioning through maximized tip visibility
NanoWorld® Arrow™ ultra high frequency AFM probes are capable of resonating with a very high frequency of up to 2.0 MHz. This probe type combines outstanding sensitivity with fast scanning ability. All probes of the Arrow™ series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The probes feature a cantilever with a triangular free end and a tetrahedral tip with a typical height of 3 µm.
Additionally, this AFM probe offers a tip radius of curvature of less than 10 nm.
The unique Arrow™ shape with the tip position at the very end of the cantilever allows easy positioning of the tip on the area of interest.
If needed, specific cantilever thicknesses can be selected within very narrow tolerances for an additional fee.
A trapezoidal cross section of the cantilever and therefore 30% wider (e.g. NCH) cantilever detector side result in easier and faster laser adjustment. Additionally, because there is simply more space to place and reflect the laser beam, a higher SUM signal is reached.
Tip shape: Arrow
Aluminum Reflex Coating
The aluminum reflex coating consists of a 30 nm thick aluminum layer deposited on the detector side of the cantilever which enhances the reflectance of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the cantilever.
|Order Code||Quantity||Data Sheet|
NanoWorld® Arrow™ Ultra High Frequency Probes (UHF) Screencast
For detailed information about our AFM probe product series please see below: