Arrow™ Silicon AFM Probes

Optimized positioning through maximized tip visibility

Our Arrow™ AFM probes are designed for easy tip positioning and high resolution AFM imaging. They fit to all well-known commercial SPMs (Scanning Probe Microscopes) and AFMs (Atomic Force Microscopes). The AFM probe consists of an AFM probe support chip with an AFM cantilever which has a tetrahedral AFM tip at its triangular free end.

The AFM probe is entirely made of monolithic, highly doped silicon.

The unique Arrow™ shape of the AFM cantilever allows easy positioning of the AFM tip on the area of interest. Furthermore the Arrow™ AFM probe series also includes a range of tipless AFM cantilevers and AFM cantilever arrays.

You can find further information on the following page:

Application Order Code Tip Side Coating Detector Side Coating Res. Frequency Force Constant
Contact mode Arrow™ CONT None None 14 kHz 0.2 N/m
Arrow™ CONTR None Reflex (Al) 14 kHz 0.2 N/m
Arrow™ CONTPt PtIr5 PtIr5 14 kHz 0.2 N/m
Force modulation mode Arrow™ FM None None 75 kHz 2.8 N/m
Arrow™ FMR None Reflex (Al) 75 kHz 2.8 N/m
Arrow™ EFM PtIr5 PtIr5 75 kHz 2.8 N/m
Non-contact / tapping mode Arrow™ NC None None 285 kHz 42 N/m
Arrow™ NCR None Reflex (Al) 285 kHz 42 N/m
Arrow™ NCPt PtIr5 PtIr5 285 kHz 42 N/m
Non-contact / tapping mode (ultra high frequency) Arrow™ UHF None Reflex (Al) 2000 kHz Info
Arrow™ UHFAuD None Reflex (Au) 2000 kHz Info
Tipless cantilevers and cantilever arrays Arrow™ TL1 None None 6.0 kHz 0.03 N/m
Arrow™ TL1Au Au None 6.0 kHz 0.03 N/m
Arrow™ TL2
(2 cantilevers)
None None 6.0 kHz 0.03 N/m
Arrow™ TL2Au
(2 cantilevers)
Au None 6.0 kHz 0.03 N/m
Arrow™ TL8
(8 cantilevers)
None None 6.0 kHz 0.03 N/m
Arrow™ TL8Au
(8 cantilevers)
Au None 6.0 kHz 0.03 N/m

All data are subject to change without notice.
All data are typical values, for guaranteed specifications see detailed description of probe type.

In addition, special silicon AFM probes can be designed and manufactured upon customer's request.
Please contact our development team at developers@nanoworld.com.

For detailed information about our AFM probe product series please see below: