Our Arrow™ AFM probes are designed for easy tip positioning and high resolution AFM imaging. They fit to all well-known commercial SPMs (Scanning Probe Microscopes) and AFMs (Atomic Force Microscopes). The AFM probe consists of an AFM probe support chip with an AFM cantilever which has a tetrahedral AFM tip at its triangular free end.
The AFM probe is entirely made of monolithic, highly doped silicon.
The unique Arrow™ shape of the AFM cantilever allows easy positioning of the AFM tip on the area of interest. Furthermore the Arrow™ AFM probe series also includes a range of tipless AFM cantilevers and AFM cantilever arrays.
You can find further information on the following page: