Type: Arrow™ FMR
Force Modulation Mode - Reflex Coating
|Resonance Frequency||75 kHz||58 - 97 kHz|
|Force Constant||2.8 N/m||1.4 - 5.8 N/m|
|Length||240 µm||235 - 245 µm|
|Mean Width||35 µm||30 - 40 µm|
|Thickness||3 µm||2.5 - 3.5 µm|
Optimized positioning through maximized AFM tip visibility
NanoWorld® Arrow™ FM probes are designed for Force Modulation Mode imaging. The Force Constant of the FM type fills the gap between Contact and Non-Contact AFM probes. Furthermore Non-Contact / TappingMode™ imaging is possible with this AFM probe.
All SPM and AFM probes of the Arrow™ series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. These AFM probes feature a rectangular AFM cantilever with a triangular free end and a tetrahedral AFM tip with a typical height of 10 - 15 µm.
Additionally, this AFM probe offers an AFM tip radius of curvature of less than 10 nm.
The unique Arrow™ shape with the AFM tip position at the very end of the AFM cantilever allows easy positioning of the AFM tip on the area of interest.
A trapezoidal cross section of the AFM cantilever and therefore 30% wider (e.g. NCH) AFM cantilever detector side result in easier and faster laser adjustment. Additionally, because there is simply more space to place and reflect the laser beam, a higher SUM signal is reached.
Tip shape: Arrow
Aluminum Reflex Coating
The aluminum reflex coating consists of a 30 nm thick aluminum layer deposited on the detector side of the AFM cantilever which enhances the reflectance of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the AFM cantilever.
|Order Code||Quantity||Data Sheet|
NanoWorld® Arrow™ Silicon AFM Probes Screencast
For detailed information about our AFM probe product series please see below: