Pyrex-Nitride AFM Probes

Leading edge in AFM tip sharpness and durability

NanoWorld® Pyrex-Nitride AFM probes are designed for various imaging applications in contact or dynamic mode AFM. They fit to all well-known commercial SPMs (Scanning Probe Microscopes) and AFMs (Atomic Force Microscopes).

The NanoWorld® Pyrex-Nitride AFM probes consist of silicon nitride AFM cantilevers and AFM tips supported by an AFM support chip made of pyrex-glass.

Currently four different versions of Pyrex-Nitride AFM probes are available: AFM probes with rectangular AFM cantilevers, AFM probes with triangular AFM cantilevers, AFM probes with one single triangular AFM cantilever for PeakForce Tapping™* and ScanAsyst®* and AFM probes with triangular AFM cantilevers without AFM tips.

For detailed information see below:

Application: Contact mode or tapping mode
Type Cantilever(s) Shape Tip Side Coating Detector Side Coating Res. Frequency Force Constant
PNP-DB Beam None Reflex (Au) CB1: 67 kHz
CB2: 17 kHz
CB1: 0.48 N/m
CB2: 0.06 N/m
PNP-TR Triangle None Reflex (Au) CB1: 67 kHz
CB2: 17 kHz
CB1: 0.32 N/m
CB2: 0.08 N/m
PNP-TR-Au
(2 cantilevers)
Triangle Au Reflex (Au) CB1: 67 kHz
CB2: 17 kHz
CB1: 0.32 N/m
CB2: 0.08 N/m
PNP-TRS Triangle None Reflex (Au) 67 kHz 0.32 N/m
PNP-TR-TL Triangle None Reflex (Au) CB1: 67 kHz
CB2: 17 kHz
CB1: 0.32 N/m
CB2: 0.08 N/m
PNP-TR-TL-Au Triangle Au Reflex (Au) CB1: 67 kHz
CB2: 17 kHz
CB1: 0.32 N/m
CB2: 0.08 N/m

All data are subject to change without notice.
All data are typical values, for guaranteed specifications see detailed description of probe type.

In addition, special silicon AFM probes can be designed and manufactured upon customer's request.
Please contact our development team at developers@nanoworld.com.

PeakForce Tapping™ and ScanAsyst® are registered trademarks of Bruker Corporation

For detailed information about our AFM probe product series please see below: