Pyrex-Nitride Probe – TRiangular AFM Cantilevers
|Cantilever Data*||Cant. 1||Cant. 2|
|Resonance Frequency||67 kHz||17 kHz|
|Force Constant||0.32 N/m||0.08 N/m|
|Length||100 µm||200 µm|
|Mean Width||13.5 µm||28 µm|
|Thickness||500 nm||500 nm|
Leading edge in sharpness and durability
NanoWorld® Pyrex-Nitride AFM probes are designed for various imaging applications in contact or dynamic mode.
The Pyrex-Nitride AFM probes have silicon nitride AFM cantilevers with very low force constants and integrated oxide sharpened, pyramidal AFM tips with a height of 3.5 µm. The AFM tip is located 4 µm behind the free end of the AFM cantilever. The AFM probe series features a support chip that is made of Pyrex. The TR series features two different triangular AFM cantilevers.
The typical AFM tip radius of curvature is below 10 nm.
All chips are pre-separated prior to shipment and come in Gel-Pak containers.
Tip shape: Pyramid
Gold Reflex Coating
The gold reflex coating consists of a 70 nm thick gold layer deposited on the detector side of the AFM cantilevers which enhances the reflectance of the laser beam. Furthermore it prevents light from interfering within the AFM cantilever.
As the coating is almost stress-free the bending of the AFM cantilevers due to stress is less than 2 degrees.
NanoWorld® Pyrex-Nitride AFM Probes (PNP) Screencast
For detailed information about our AFM probe product series please see below: