POINTPROBE® silicon AFM probes

Most widely used and best-known AFM probe world-wide

Our Pointprobe® is a versatile silicon AFM probe for very high resolution AFM imaging and fits to all well-known commercial SPMs (Scanning Probe Microscopes) and AFMs (Atomic Force Microscopes). It consists of a single crystal silicon AFM cantilever with an integrated single crystal silicon AFM tip. The AFM cantilever and the AFM tip are supported by a single crystal silicon AFM support chip. True atomic resolution has been achieved by several research facilities in UHV using our Non-Contact / Tapping Mode AFM probes NCH and NCL.

The AFM probes of the Pointprobe® series are the most widely used and best known AFM probes worldwide. The product series comprises AFM  probes for the widest range of applications. The Pointprobe® AFM probes are available with different coatings like Platinum-Iridium (PtIr5), Magnetic, Diamond or Gold.

Additionally we offer special AFM tip versions such as our SuperSharpSilicon™ for high resolution imaging or High Aspect Ratio Tips for deep trench measurements.

For detailed information see below:

Application Order Code Tip Side Coating Detector Side Coating Res. Frequency Force Constant Features
Contact mode CONT None None 13 kHz 0.2 N/m Standard tip shape
CONTR None Reflex (Al) 13 kHz 0.2 N/m Standard tip shape
CONTPt PtIr5 PtIr5 13 kHz 0.2 N/m Standard tip shape
Contact mode (short cantilever) CONTSC None None 25 kHz 0.2 N/m Short cantilever
CONTSCR None Reflex (Al) 25 kHz 0.2 N/m Short cantilever
Contact mode (Seiko or Zeiss) ZEILR None Reflex (Al) 27 kHz 1.6 N/m Standard tip shape
Non-contact / tapping mode (high frequency) NCH None None 320 kHz 42 N/m Standard tip shape
NCHR None Reflex (Al) 320 kHz 42 N/m Standard tip shape
NCHPt PtIr5 PtIr5 320 kHz 42 N/m Standard tip shape
SSS-NCH None None 320 kHz 42 N/m SuperSharpSilicon™ tip
AR5-NCHR None Reflex (Al) 320 kHz 42 N/m High Aspect Ratio Tip (5:1)
AR10-NCHR None Reflex (Al) 320 kHz 42 N/m High Aspect Ratio Tip (10:1)
AR5T-NCHR None Reflex (Al) 330 kHz 42 N/m Tilt compensated High Aspect Ratio Tip (5:1)
DT-NCHR Diamond Reflex (Al) 400 kHz 80 N/m Diamond coated tip
CDT-NCHR Conductive diamond Reflex (Al) 400 kHz 80 N/m Conductive diamond coated tip
Non-contact / soft tapping mode NCST None None 160 kHz 7.4 N/m Standard tip shape
NCSTR None Reflex (Al) 160 kHz 7.4 N/m Standard tip shape
Non-contact / tapping mode (long cantilever) NCL None None 190 kHz 48 N/m Standard tip shape
NCLR None Reflex (Al) 190 kHz 48 N/m Standard tip shape
NCLPt PtIr5 PtIr5 190 kHz 48 N/m Standard tip shape
SSS-NCL None None 190 kHz 48 N/m SuperSharpSilicon™ tip
AR5-NCLR None Reflex (Al) 190 kHz 48 N/m High Aspect Ratio Tip (5:1)
DT-NCLR Diamond Reflex (Al) 210 kHz 72 N/m Diamond coated tip
CDT-NCLR Conductive diamond Reflex (Al) 210 kHz 72 N/m Conductive diamond coated tip
Non-contact / tapping mode (Seiko non-contact mode) SEIHR None Reflex (Al) 130 kHz 15 N/m Standard tip shape
SSS-SEIH None None 130 kHz 15 N/m SuperSharpSilicon™ tip
Force modulation mode FM None None 75 kHz 2.8 N/m Standard tip shape
FMR None Reflex (Al) 75 kHz 2.8 N/m Standard tip shape
DT-FMR Diamond Reflex (Al) 105 kHz 6.2 N/m Diamond coated tip
CDT-FMR Conductive diamond Reflex (Al) 105 kHz 6.2 N/m Conductive diamond coated tip
Electrostatic force microscopy EFM PtIr5 PtIr5 75 kHz 2.8 N/m Standard tip shape
Magnetic force microscopy MFMR Hard magnetic, medium momentum Reflex (Al) 75 kHz 2.8 N/m Standard tip shape
S-MFMR Soft magnetic, medium momentum Reflex (Al) 75 kHz 2.8 N/m Standard tip shape
  • SSS SuperSharpSilicon™ Tip

  • AR5 High Aspect Ratio Tip (5:1)

  • AR10 High Aspect Ratio Tip (10:1)

  • AR5T Tilt Compensated High Aspect Ratio Tip (5:1)

  • DT Diamond Coated Tip

  • CDT Conductive Diamond Coated Tip

  • PtIr5 Platinum Iridium5 Coating

  • Reflex (Al) Platinum Iridium5 Coating

All data are subject to change without notice.
All data are typical values, for guaranteed specifications see detailed description of probe type.

In addition, special silicon AFM probes can be designed and manufactured upon customer's request.
Please contact our development team at developers@nanoworld.com.

For detailed information about our AFM probe product series please see below: