Our Pointprobe® is a versatile silicon AFM probe for very high resolution AFM imaging and fits to all well-known commercial SPMs (Scanning Probe Microscopes) and AFMs (Atomic Force Microscopes). It consists of a single crystal silicon AFM cantilever with an integrated single crystal silicon AFM tip. The AFM cantilever and the AFM tip are supported by a single crystal silicon AFM support chip. True atomic resolution has been achieved by several research facilities in UHV using our Non-Contact / Tapping Mode AFM probes NCH and NCL.
The AFM probes of the Pointprobe® series are the most widely used and best known AFM probes worldwide. The product series comprises AFM probes for the widest range of applications. The Pointprobe® AFM probes are available with different coatings like Platinum-Iridium (PtIr5), Magnetic, Diamond or Gold.
Additionally we offer special AFM tip versions such as our SuperSharpSilicon™ for high resolution imaging or High Aspect Ratio Tips for deep trench measurements.
For detailed information see below: