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POINTPROBE® silicon AFM probes
Most widely used and best-known AFM probe world-wide

Our Pointprobe® is a versatile silicon AFM probe for very high resolution imaging and fits to all well-known commercial SPMs (Scanning Probe Microscopes). It consists of a single crystal silicon cantilever with integrated single crystal silicon tip. The cantilever and the tip are supported by a single crystal silicon support chip. True atomic resolution has been achieved by several research facilities in UHV using our Non-Contact / TappingMode AFM probes NCH and NCL.

The AFM probes of the Pointprobe series are the most widely used and best known AFM probes worldwide. The product series comprises scanning probes for the widest range of applications. The Pointprobe AFM probes are available with different coatings like Platinum-Iridium (PtIr5), Magnetic, Diamond or Gold.

Additionally we offer special tip versions like our SuperSharpSilicon for high resolution imaging or High Aspect Ratio Tips for deep trench measurements.

For detailed information see below:
  • General Description Pointprobe® Silicon AFM Probes
  • Special Tip Versions
  • Available Coatings

  • AFM Probes Guide and AFM Probes Brochure are available for free download.

    Application Type Tip Side Coating Detector Side Coating Special Tip Versions Res. Frequency Force Constant
    Contact mode CONT none, PtIr5 none, Reflex (Al), PtIr5 n.a. 13 kHz 0.2 N/m
    Contact mode (Short Cantilever) CONTSC none none, Reflex (Al) n.a. 25 kHz 0.2 N/m
    Contact mode, Seiko or Zeiss ZEILR none Reflex (Al) n.a. 27 kHz 1.6 N/m
    Non-contact / tapping mode
    (high frequency)
    NCH none, PtIr5, Diamond, Conductive Diamond none, Reflex (Al), PtIr5 AR5, AR10, AR5T
    SSS, PtIr5, DT, CDT
    330 kHz 42 N/m
    Non-contact / soft tapping NCST none none, Reflex (Al) n.a. 160 kHz 7.4 N/m
    Non-contact / tapping mode
    (long cantilever)
    NCL none, PtIr5, Diamond, Conductive Diamond none, PtIr5, Reflex (Al) SSS, AR5, DT, CDT 190 kHz 48 N/m
    Non-contact / tapping mode
    (Seiko non-contact mode)
    SEIHR none none, Reflex (Al) SSS 130 kHz 15 N/m
    Force modulation mode FM none, DT, CDT none, Reflex (Al) DT, CDT 75 kHz 2.8 N/m
    Electrostatic force microscopy EFM PtIr5 PtIr5 n.a. 75 kHz 2.8 N/m
    Magnetic force microscopy
    Hard magnetic
    MFMR Hard Magnetic, Medium Momentum Reflex (Al) n.a. 75 kHz 2.8 N/m
    Magnetic force microscopy
    Soft magnetic
    S-MFMR Soft Magnetic Reflex (Al) n.a. 75 kHz 2.8 N/m
    SSS -> SuperSharpSilicon Tip DT -> Diamond Coated Tip
    AR5 -> High Aspect Ratio Tip (5:1) CDT -> Conductive Diamond Coated Tip
    AR10 -> High Aspect Ratio Tip (10:1) PtIr5 -> Platinum Iridium5 Coating
    AR5T -> Tilt Compensated High Aspect Ratio Tip (5:1) Reflex (Al) -> Aluminum Reflex Coating

    All data are subject to change without notice.
    All data are typical values, for guaranteed specifications see detailed description of probe type.

    In addition, special silicon AFM probes can be designed and manufactured upon customer's request.
    Please contact our development team at
    For detailed information about our AFM probe product series please see below: