Non-contact / Tapping™ mode - High resonance frequency
|Resonance Frequency||320 kHz||250 - 390 kHz|
|Force Constant||42 N/m||21 - 78 N/m|
|Length||125 µm||120 - 130 µm|
|Mean Width||30 µm||25 - 35 µm|
|Thickness||4 µm||3.5 - 4.5 µm|
This AFM probe has alignment grooves on the back side of the support chip.
Point Probe AFM tip
NanoWorld® Pointprobe® NCH probes are designed for non-contact or tapping mode imaging. This AFM probe type combines high operation stability with outstanding sensitivity and fast scanning ability.
All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid with a typical height of 10 - 15 µm.
Additionally, this AFM probe offers typical tip radius of curvature of less than 8 nm.
For applications requiring lower resonance frequencies or a AFM cantilever length exceeding 125 µm we recommend our Pointprobe® type NCL.
A trapezoidal cross section of the AFM cantilever and therefore 30% wider (e.g. NCH) AFM cantilever detector side result in easier and faster laser adjustment. Additionally, because there is simply more space to place and reflect the laser beam, a higher SUM signal is reached.
Tip shape: Standard
NanoWorld® Pointprobe® Silicon AFM Probes Screencast (Standard AFM Tip)
For detailed information about our AFM probe product series please see below: