Non-contact / Tapping™ mode - Long AFM Cantilever - Reflex coating
|160 - 210 kHz
|31 - 71 N/m
|220 - 230 µm
|33 - 43 µm
|6.5 - 7.5 µm
This AFM probe has alignment grooves on the back side of the support chip.
Pointprobe® AFM tip
NanoWorld® Pointprobe® NCL probes are designed for non-contact or tapping mode imaging and offer an alternative to our high frequency non-contact type NCH. The NCL type is recommended if the feedback loop of the microscope does not accept high frequencies or if the detection system needs a minimum AFM cantilever length (> 125 µm). This AFM probe combines high operation stability with outstanding sensitivity. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced.
All SPM and AFM AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid with a typical height of 10 - 15 µm.
Additionally, this AFM probe offers typical AFM tip radius of curvature of less than 8 nm.
For applications allowing higher resonance frequencies or a shorter AFM cantilever length we recommend our Pointprobe® type NCHR.
A trapezoidal cross section of the AFM cantilever and therefore 30% wider (e.g. NCH) AFM cantilever detector side result in easier and faster laser adjustment. Additionally, because there is simply more space to place and reflect the laser beam, a higher SUM signal is reached.
Tip shape: Standard
Aluminum Reflex Coating
The aluminum reflex coating consists of a 30 nm thick aluminum layer deposited on the detector side of the AFM cantilever which enhances the reflectance of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the AFM cantilever.
NanoWorld® Pointprobe® Silicon AFM Probes Screencast (Standard AFM Tip)
For detailed information about our AFM probe product series please see below: