Non-contact / Tapping™ mode -
High resonance frequency - Reflex coating
|250 - 390 kHz
|21 - 78 N/m
|120 - 130 µm
|25 - 35 µm
|3.5 - 4.5 µm
This AFM probe has alignment grooves on the back side of the support chip.
Pointprobe® AFM tip
NanoWorld® Pointprobe® NCH probes are designed for non-contact or tapping mode imaging. This AFM probe type combines high operation stability with outstanding sensitivity and fast scanning ability.
All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped silicon to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid with a typical height of 10 - 15 µm.
Additionally, this AFM probe offers typical AFM tip radius of curvature of less than 8 nm.
For applications requiring lower resonance frequencies or an AFM cantilever length exceeding 125 µm we recommend our Pointprobe® type NCLR.
A trapezoidal cross section of the AFM cantilever and therefore 30% wider (e.g. NCH) AFM cantilever detector side result in easier and faster laser adjustment. Additionally, because there is simply more space to place and reflect the laser beam, a higher SUM signal is reached.
Tip shape: Standard
Aluminum Reflex Coating
The aluminum reflex coating consists of a 30 nm thick aluminum layer deposited on the detector side of the AFM cantilever which enhances the reflectance of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the AFM cantilever.
NanoWorld® Pointprobe® Silicon AFM Probes Screencast (Standard AFM Tip)
For detailed information about our AFM probe product series please see below: