Non-contact / Soft Tapping mode Reflex coating

Cantilever Data Value Range*
Resonance Frequency 160 kHz 120 - 205 kHz
Force Constant 7.4 N/m 3 - 16 N/m
Length 150 µm 145 - 155 µm
Mean Width 27 µm 22 - 32 µm
Thickness 2.8 µm 2.3 - 3.3 µm

This AFM probe has alignment grooves on the back side of the support chip.

Pointprobe® AFM tip

Pointprobe® AFM tip

Product Description

NanoWorld® Pointprobe® NCSTR AFM probes are designed for non-contact or soft tapping mode imaging. The combination of soft AFM cantilever and fairly high resonance frequency enables stable and fast measurements with reduced AFM tip-sample interaction. Thus, AFM tip and sample wear could be significantly decreased.

All probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid with a typical height of 10 - 15 µm.

Additionally, this AFM probe offers a typical tip radius of curvature of less than 8 nm.

For applications requiring lower resonance frequencies or an AFM cantilever length exceeding 150 µm we recommend our Pointprobe® type NCLR. For standard non-contact / tapping mode application we recommend our Pointprobe® type NCHR.

Image A trapezoidal cross section of the AFM cantilever and therefore 30% wider (e.g. NCH) AFM cantilever detector side result in easier and faster laser adjustment. Additionally, because there is simply more space to place and reflect the laser beam, a higher SUM signal is reached.

Tip shape: Standard

Coating: Reflective Aluminum

Aluminum Reflex Coating

The aluminum reflex coating consists of a 30 nm thick aluminum layer deposited on the detector side of the AFM cantilever which enhances the reflectance of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the AFM cantilever.

Order Codes

Order Code Quantity Data Sheet
NCSTR-10 10 yes
NCSTR-20 20 yes
NCSTR-50 50 no
NCSTR-W 380 yes

NanoWorld® Pointprobe® Silicon AFM Probes Screencast (Standard AFM Tip)

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Bruker® is a trademark of Bruker Corporation

For more information contact: info@nanoworld.com

Pointprobe® is a registered trademark of NanoWorld AG

All data are subject to change without notice.

NanoWorld AG
Rue des Saars 10
CH-2000 Neuchâtel,

For detailed information about our AFM probe product series please see below: