Non-contact / Soft Tapping mode
|Resonance Frequency||160 kHz||120 - 205 kHz|
|Force Constant||7.4 N/m||3 - 16 N/m|
|Length||150 µm||145 - 155 µm|
|Mean Width||27 µm||22 - 32 µm|
|Thickness||2.8 µm||2.3 - 3.3 µm|
This AFM probe has alignment grooves on the back side of the support chip.
Point Probe AFM tip
NanoWorld® Pointprobe® NCST AFM probes are designed for non-contact or soft tapping mode imaging. The combination of soft AFM cantilever and fairly high resonance frequency enables stable and fast measurements with reduced AFM tip-sample interaction. Thus, AFM tip and sample wear could be significantly decreased.
All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid with a typical height of 10 - 15 µm.
Additionally, this AFM probe offers a typical AFM tip radius of curvature of less than 8 nm.
For applications requiring lower resonance frequencies or an AFM cantilever length exceeding 150 µm we recommend our Pointprobe® type NCL. For standard non-contact / tapping mode application we recommend our Pointprobe® type NCH.
A trapezoidal cross section of the AFM cantilever and therefore 30% wider (e.g. NCH) AFM cantilever detector side result in easier and faster laser adjustment. Additionally, because there is simply more space to place and reflect the laser beam, a higher SUM signal is reached.
Tip shape: Standard
|Order Code||Quantity||Data Sheet|
NanoWorld® Pointprobe® Silicon AFM Probes Screencast (Standard AFM Tip)
For detailed information about our AFM probe product series please see below: