Type: SEIHR

SEIKO INSTRUMENTS microscopes - Non-contact mode - High force constant - Reflex coating

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Cantilever Data Value Range*
Resonance Frequency 130 kHz 110 - 150 kHz
Force Constant 15 N/m 9 - 25 N/m
Length 225 µm 220 - 230 µm
Mean Width 33 µm 27.5 - 37.5 µm
Thickness 5 µm 4.5 - 5.5 µm

This AFM probe has alignment grooves on the back side of the support chip.

Pointprobe® AFM tip

Pointprobe® AFM tip

Product Description

NanoWorld® Pointprobe® SEIHR probes are designed for owners of a Seiko Instruments microscope using the non-contact mode. All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid with a typical height of 10 - 15 µm.

Additionally, this AFM probe offers typical AFM tip radius of curvature of less than 8 nm.

Image A trapezoidal cross section of the AFM cantilever and therefore 30% wider (e.g. NCH) AFM cantilever detector side result in easier and faster laser adjustment. Additionally, because there is simply more space to place and reflect the laser beam, a higher SUM signal is reached.

Tip shape: Standard

Coating: Reflective Aluminum

Aluminum Reflex Coating

The aluminum reflex coating consists of a 30 nm thick aluminum layer deposited on the detector side of the AFM cantilever which enhances the reflectance of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the AFM cantilever.

Order Codes

Order Code Quantity Data Sheet
SEIHR-10 10 yes
SEIHR-20 20 yes
SEIHR-50 50 no
SEIHR-W 380 yes

NanoWorld® Pointprobe® Silicon AFM Probes Screencast (Standard AFM Tip)

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Bruker® is a trademark of Bruker Corporation

For more information contact: info@nanoworld.com

Pointprobe® is a registered trademark of NanoWorld AG

All data are subject to change without notice.

NanoWorld AG
Rue des Saars 10
CH-2000 Neuchâtel,
Switzerland
www.nanoworld.com

For detailed information about our AFM probe product series please see below: