Type: Arrow™ NC
Non-contact / Tapping™ mode
|Resonance Frequency||285 kHz||240 - 380 kHz|
|Force Constant||42 N/m||27 - 80 N/m|
|Length||160 µm||155 - 165 µm|
|Mean Width||45 µm||40 - 50 µm|
|Thickness||4.6 µm||4.1 - 5.1 µm|
Optimized positioning through maximized AFM tip visibility
NanoWorld® Arrow™ NC probes are designed for non-contact or tapping mode imaging. This AFM probe type combines high operation stability with outstanding sensitivity and fast scanning ability.
All SPM and AFM probes of the Arrow™ series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. These AFM probes feature a rectangular AFM cantilever with a triangular free end and a tetrahedral AFM tip with a typical height of 10 - 15 µm.
Additionally, this AFM probe offers an AFM tip radius of curvature of less than 10 nm.
The unique Arrow™ shape with the AFM tip position at the very end of the AFM cantilever allows easy positioning of the AFM tip on the area of interest.
A trapezoidal cross section of the AFM cantilever and therefore 30% wider (e.g. NCH) AFM cantilever detector side result in easier and faster laser adjustment. Additionally, because there is simply more space to place and reflect the laser beam, a higher SUM signal is reached.
Tip shape: Arrow
|Order Code||Quantity||Data Sheet|
NanoWorld® Arrow™ Silicon AFM Probes Screencast
For detailed information about our AFM probe product series please see below: