Type: Arrow™ NC
Non-contact / Tapping™ mode
|Resonance Frequency||285 kHz||240 - 380 kHz|
|Force Constant||42 N/m||27 - 80 N/m|
|Length||160 µm||155 - 165 µm|
|Mean Width||45 µm||40 - 50 µm|
|Thickness||4.6 µm||4.1 - 5.1 µm|
Optimized positioning through maximized tip visibility
NanoWorld® Arrow™ NC probes are designed for non-contact or tapping mode imaging. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.
All SPM and AFM probes of the Arrow™ series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. These probes feature a rectangular cantilever with a triangular free end and a tetrahedral tip with a typical height of 10 - 15 µm.
Additionally, this probe offers a tip radius of curvature of less than 10 nm.
The unique Arrow™ shape with the tip position at the very end of the cantilever allows easy positioning of the tip on the area of interest.
A trapezoidal cross section of the cantilever and therefore 30% wider (e.g. NCH) cantilever detector side result in easier and faster laser adjustment. Additionally, because there is simply more space to place and reflect the laser beam, a higher SUM signal is reached.
Tip shape: Arrow
|Order Code||Quantity||Data Sheet|
NanoWorld® Arrow™ Silicon AFM Probes Screencast
For detailed information about our AFM probe product series please see below: