Type: Arrow™ NCR

Arrow™ - Non-contact / Tapping™ mode - Reflex coating

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Cantilever Data Value Range*
Resonance Frequency 285 kHz 240 - 380 kHz
Force Constant 42 N/m 27 - 80 N/m
Length 160 µm 155 - 165 µm
Mean Width 45 µm 40 - 50 µm
Thickness 4.6 µm 4.1 - 5.1 µm
ARROW™ AFM tip

ARROW™ AFM tip More images

Product Description

Optimized positioning through maximized tip visibility

NanoWorld® Arrow™ NC probes are designed for non-contact or tapping mode imaging. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

All SPM and AFM probes of the Arrow™ series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. These probes feature a rectangular cantilever with a triangular free end and a tetrahedral tip with a typical height of 10 - 15 µm.

Additionally, this probe offers a typical tip radius of curvature of less than 10 nm.

The unique Arrow™ shape with the tip position at the very end of the cantilever allows easy positioning of the tip on the area of interest.

Image A trapezoidal cross section of the cantilever and therefore 30% wider (e.g. NCH) cantilever detector side result in easier and faster laser adjustment. Additionally, because there is simply more space to place and reflect the laser beam, a higher SUM signal is reached.

Tip shape: Arrow

Coating: Reflex Aluminum

Aluminum Reflex Coating

The aluminum reflex coating consists of a 30 nm thick aluminum layer deposited on the detector side of the cantilever which enhances the reflectance of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the cantilever.

Order Codes

Order Code Quantity Data Sheet
ARROW-NCR-10 10 Nominal values
ARROW-NCR-20 20 Nominal values
ARROW-NCR-50 50 Nominal values
ARROW-NCR-W 380 Nominal values

NanoWorld® Arrow™ Silicon AFM Probes Screencast

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Guaranteed values

For more information contact: info@nanoworld.com

Pointprobe® is a registered trademark of NanoWorld AG

All data are subject to change without notice.

NanoWorld AG
Rue des Saars 10
CH-2000 Neuchâtel,
Switzerland
www.nanoworld.com

For detailed information about our AFM probe product series please see below: