PointProbe® Series Silicon AFM Tips - General Description
General
- SPM and AFM probes for very high resolution imaging
- fit to all well-known commercial SPMs and AFMs
- cantilever and tip are supported by a single crystal silicon support chip
- monolithic design of support chip, cantilever and tip
Material Features
- highly doped, single crystal silicon (resistivity 0.01 - 0.025 Ohm•cm)
- no intrinsic stress and absolutely straight cantilevers
- chemically inert silicon for application in fluids or electrochemical cells
Cantilever
- rectangular cantilever with trapezoidal cross section
- wide detector side for easy laser beam adjustment
- small width at the tip side reduces damping
Support Chip
- cantilever is integrated into a silicon support chip
- dimensions of the support chip are very reproducible (3.4 mm x 1.6 mm x 0.3 mm)
- alignment grooves on the back side of the silicon support chip in conjunction with the alignment chip ensure replacement of the probes without major readjustment of the laser beam
Tip
- tip is shaped like a polygon based pyramid
- tip height 10-15 µm and radius of curvature typically < 8 nm (< 12 nm guaranteed)
- macroscopic half cone angles :
- 20° to 25° seen along the cantilever axis
- 25° to 30° seen from the side
For detailed information about our AFM probe product series please see below: