PointProbe® Series Silicon AFM Tips - General Description


  • SPM and AFM probes for very high resolution imaging
  • fit to all well-known commercial SPMs and AFMs
  • AFM cantilever and AFM tip are supported by a single crystal silicon support chip
  • monolithic design of support chip, AFM cantilever and AFM tip

Material Features

  • highly doped, single crystal silicon (resistivity 0.01 - 0.025 Ohm•cm)
  • no intrinsic stress and absolutely straight AFM cantilevers
  • chemically inert silicon for application in fluids or electrochemical cells

AFM Cantilever

  • rectangular AFM cantilever with trapezoidal cross section
  • wide detector side for easy laser beam adjustment
  • small width at the tip side reduces damping

Support Chip

  • AFM cantilever is integrated into a silicon support chip
  • dimensions of the support chip are very reproducible (3.4 mm x 1.6 mm x 0.3 mm)
  • alignment grooves on the back side of the silicon support chip in conjunction with the alignment chip ensure replacement of the probes without major readjustment of the laser beam


  • AFM tip is shaped like a polygon based pyramid
  • AFM tip height 10-15 µm and radius of curvature typically < 8 nm (< 12 nm guaranteed)
  • macroscopic half cone angles :
        - 20° to 25° seen along the AFM cantilever axis
        - 25° to 30° seen from the side

For detailed information about our AFM probe product series please see below: