Contact Mode – Short Cantilever
|Resonance Frequency||25 kHz||10 - 39 kHz|
|Force Constant||0.2 N/m||0.02 - 0.7 N/m|
|Length||225 µm||220 - 230 µm|
|Mean Width||48 µm||42.5 - 52.5 µm|
|Thickness||1 µm||0.5 - 1.5 µm|
This AFM probe has alignment grooves on the back side of the support chip.
Point Probe AFM tip
NanoWorld® Pointprobe® CONTSC AFM probe is an alternative cantilever type for contact mode applications. The length of cantilever is reduced with respect to the preferred contact mode type enabling easier exchange with non-contact mode probes for some AFM instruments. Additionally, this probe type allows the application for lateral or friction force mode.
All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a typical height of 10 - 15 µm.
Additionally, this probes offers typical tip radius of curvature of less than 8 nm.
A trapezoidal cross section of the cantilever and therefore 30% wider (e.g. NCH) cantilever detector side result in easier and faster laser adjustment. Additionally, because there is simply more space to place and reflect the laser beam, a higher SUM signal is reached.
Tip shape: Standard
|Order Code||Quantity||Data Sheet|
NanoWorld® Pointprobe® Silicon AFM Probes Screencast (Standard Tip)
For detailed information about our AFM probe product series please see below: