Type: ZEILR

ZEISS Veritekt microscopes - Contact mode - Low force constant - Reflex coating

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Cantilever Data Value Range*
Resonance Frequency 27 kHz 23 - 31 kHz
Force Constant 1.6 N/m 1 - 2.6 N/m
Length 450 µm 445 - 455 µm
Mean Width 55 µm 50 - 60 µm
Thickness 4 µm 3.5 - 4.5 µm

This AFM probe has alignment grooves on the back side of the support chip.

Point Probe AFM tip

Point Probe AFM tip

Product Description

NanoWorld® Pointprobe® ZEILR probes are designed for owners of the Zeiss Veritekt or a Seiko Instruments microscope using the contact mode. Compared to the Pointprobe® contact mode probes of the CONT type the force constant is slightly increased.

The probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a height of 10 - 15 µm.

Additionally, this probe offers typical tip radius of curvature of less than 8 nm.

Image A trapezoidal cross section of the cantilever and therefore 30% wider (e.g. NCH) cantilever detector side result in easier and faster laser adjustment. Additionally, because there is simply more space to place and reflect the laser beam, a higher SUM signal is reached.

Tip shape: Standard

Coating: Reflex Aluminum

Aluminum Reflex Coating

The aluminum reflex coating consists of a 30 nm thick aluminum layer deposited on the detector side of the cantilever which enhances the reflectance of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the cantilever.

Order Codes

Order Code Quantity Data Sheet
ZEILR-10 10 yes
ZEILR-20 20 yes
ZEILR-50 50 no
ZEILR-W 380 yes

NanoWorld® Pointprobe® Silicon AFM Probes Screencast (Standard Tip)

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Guaranteed values

For more information contact: info@nanoworld.com

Pointprobe® is a registered trademark of NanoWorld AG

All data are subject to change without notice.

NanoWorld AG
Rue des Saars 10
CH-2000 Neuchâtel,
Switzerland
www.nanoworld.com

For detailed information about our AFM probe product series please see below: