Type: Arrow™ CONTR

Contact Mode - Reflex Coating

Logo
Cantilever Data Value Range*
Resonance Frequency 14 kHz 10 - 19 kHz
Force Constant 0.2 N/m 0.06 - 0.38 N/m
Length 450 µm 445 - 455 µm
Mean Width 45 µm 40 - 50 µm
Thickness 2 µm 1.5 - 2.5 µm
ARROW™ AFM tip

ARROW™ AFM tip

Product Description

Optimized positioning through maximized AFM tip visibility

NanoWorld® Arrow™ CONT AFM probes are designed for Contact Mode imaging. Furthermore this type can be used for Force Distance Spectroscopy Mode or Pulsed Force Mode (PFM). The CONT type is optimized for high sensitivity due to a low Force Constant.

All SPM and AFM probes of the Arrow™ series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. These AFM probes feature a rectangular AFM cantilever with a triangular free end and a tetrahedral AFM tip with a typical height of 10 - 15 µm.

Additionally, this AFM probe offers an AFM tip radius of curvature of less than 10 nm.

The unique Arrow™ shape with the AFM tip position at the very end of the AFM cantilever allows easy positioning of the AFM tip on the area of interest.

Image A trapezoidal cross section of the AFM cantilever and therefore 30% wider (e.g. NCH) AFM cantilever detector side result in easier and faster laser adjustment. Additionally, because there is simply more space to place and reflect the laser beam, a higher SUM signal is reached.

Tip shape: Arrow

Coating: Reflective Aluminum

Aluminum Reflex Coating

The aluminum reflex coating consists of a 30 nm thick aluminum layer deposited on the detector side of the AFM cantilever which enhances the reflectance of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the AFM cantilever.

As the coating is almost stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.

Order Codes

Order Code Quantity Data Sheet
ARROW-CONTR-10 10 Nominal values
ARROW-CONTR-20 20 Nominal values
ARROW-CONTR-50 50 Nominal values
ARROW-CONTR-W 380 Nominal values

NanoWorld® Arrow™ Silicon AFM Probes Screencast

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Scientific publications mentioning use of this AFM probe


Gerschel P, Angel S, Hammad M, Olean‐Oliveira A, Toplak B, Chanda V, Martínez‐Hincapié R, Sanden S, Khan AR, Xing D, Amin AS
Determining materials for energy conversion across scales: The alkaline oxygen evolution reaction
Carbon Energy. 2024 Dec;6(12):e608
DOI: https://doi.org/10.1002/cey2.608


Liao, Mengzhou, Paolo Nicolini, and Tomas Polcar
Separating anisotropic and isotropic friction between atomic force microscope tips and atomically flat surfaces
Physical Review B. 2023 May 15;107(19):195442
DOI: https://doi.org/10.1103/PhysRevB.107.195442


Jones, Christopher R., Zhenyu Jason Zhang, and Hung-Ji Tsai
Quantifying the mechanical properties of yeast Candida albicans using atomic force microscopy-based force spectroscopy
InAntifungal Immunity: Methods and Protocols 2023 May 6 (pp. 1-13). New York, NY: Springer US
DOI: https://doi.org/10.1007/978-1-0716-3199-7_1


Ma, Bo, Jin-Woo Kim, and Steve Tung
Single DNA translocation and electrical characterization based on atomic force microscopy and nanoelectrodes
IEEE open journal of nanotechnology. 2022 Oct 25;3:124-30
DOI: https://doi.org/10.1109/OJNANO.2022.3217108


Bayomi, Rasha Ahmed Hanafy, Takashi Aoki, Sono Sasaki, and Shinichi Sakurai
Regular ordering of spherical microdomains in dewetted monolayer islands induced by thermal annealing of spin-coated ultrathin films of a triblock copolymer
Soft Matter. 2021;17(31):7396-407
DOI: https://doi.org/10.1039/D1SM00699A


Park Jeong-In, Yong-Seob Park, Won-Je Oh, Ji-Su Park, Hyung-Youl Park, Eung-Kwon Kim, Hyung-Gwan Woo, and Jae-Hyeong Lee
Optimization of Self-Cleaning Thin-Film Layer for Photovoltaic Applications
Journal of Nanoscience and Nanotechnology. 2020 Jan 1;20(1):135-42
DOI: https://doi.org/10.1166/jnn.2020.17298


Giordani, Matteo, Georgia Cametti, Fulvio Di Lorenzo, and Sergey V. Churakov
Real-time observation of fibrous zeolites reactivity in contact with simulated lung fluids (SLFs) obtained by atomic force microscope (AFM)
Minerals. 2019 Jan 29;9(2):83.
DOI: https://doi.org/10.3390/min9020083


Im, Hyeon Seong, Ki Yoon Kwon, Jong Uk Kim, Kwang Su Kim, Hoon Yi, Pil J. Yoo, Changhyun Pang, Hoon Eui Jeong, and Tae-il Kim
Highly durable and unidirectionally stooped polymeric nanohairs for gecko-like dry adhesive
Nanotechnology. 2015 Sep 22;26(41):415301
DOI: https://doi.org /10.1088/0957-4484/26/41/415301

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All data are subject to change without notice.

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For detailed information about our AFM probe product series please see below: