Type: MFMR

Magnetic force microscopy - Reflex coating

Logo
Cantilever Data Value Range*
Resonance Frequency 75 kHz 60 - 90 kHz
Force Constant 2.8 N/m 1.2 - 5.5 N/m
Length 225 µm 220 - 230 µm
Mean Width 28 µm 22.5 - 32.5 µm
Thickness 3 µm 2.5 - 3.5 µm

This AFM probe has alignment grooves on the back side of the support chip.

Point Probe AFM tip

Point Probe AFM tip

Product Description

NanoWorld® Pointprobe® MFM probes are designed for magnetic force microscopy. The force constant and the special hard magnetic tip-side coating of the MFM type are optimised for this type of application. This type of AFM probe yields a very high force sensitivity, while simultaneously enabling tapping and lift mode operation.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid with a typical height of 10-15µm.

Additionally, this AFM probe offers unique features:

  • typical AFM tip radius of curvature <50nm
  • high magnetic contrast and lateral resolution <100nm
  • electrically conductive coating
Soft magnetic samples may be influenced by the AFM tip magnetization!

Image A trapezoidal cross section of the AFM cantilever and therefore 30% wider (e.g. NCH) AFM cantilever detector side result in easier and faster laser adjustment. Additionally, because there is simply more space to place and reflect the laser beam, a higher SUM signal is reached.

Tip shape: Standard

Coating: Magnetic

Hard Magnetic Coating / Aluminum Reflex Coating

The hard magnetic coating consists of a 40 nm thick cobalt alloy layer deposited on the tip side of the AFM cantilever which leads to a permanent magnetization of the AFM tip with the direction usually along the AFM tip axis. We recommend magnetizing the AFM tip by means of a strong magnet (e.g. a NdFeB magnet, a few millimeters in size) prior to the measurement.

The aluminum reflex coating deposited on the detector side of the AFM cantilever enhances the reflectance of the laser beam and prevents light from interfering within the AFM cantilever.

As the coating is almost stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.

Order Codes

Order Code Quantity Data Sheet
MFMR-10 10 yes
MFMR-20 20 yes
MFMR-50 50 no
MFMR-W 380 yes

NanoWorld® Magnetic Force Microscopy (MFM) AFM Probes Screencast

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Bruker® is a trademark of Bruker Corporation

For more information contact: info@nanoworld.com

Pointprobe® is a registered trademark of NanoWorld AG

All data are subject to change without notice.

NanoWorld AG
Rue des Saars 10
CH-2000 Neuchâtel,
Switzerland
www.nanoworld.com

For detailed information about our AFM probe product series please see below: