Magnetic force microscopy - Reflex coating
|Resonance Frequency||75 kHz||60 - 90 kHz|
|Force Constant||2.8 N/m||1.2 - 5.5 N/m|
|Length||225 µm||220 - 230 µm|
|Mean Width||28 µm||22.5 - 32.5 µm|
|Thickness||3 µm||2.5 - 3.5 µm|
This AFM probe has alignment grooves on the back side of the support chip.
Point Probe AFM tip
NanoWorld® Pointprobe® MFM probes are designed for magnetic force microscopy. The force constant and the special hard magnetic tip-side coating of the MFM type are optimised for this type of application. This type of AFM probe yields a very high force sensitivity, while simultaneously enabling tapping and lift mode operation.
All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid with a typical height of 10-15µm.
Additionally, this AFM probe offers unique features:
- typical AFM tip radius of curvature <50nm
- high magnetic contrast and lateral resolution <100nm
- electrically conductive coating
A trapezoidal cross section of the AFM cantilever and therefore 30% wider (e.g. NCH) AFM cantilever detector side result in easier and faster laser adjustment. Additionally, because there is simply more space to place and reflect the laser beam, a higher SUM signal is reached.
Tip shape: Standard
Hard Magnetic Coating / Aluminum Reflex Coating
The hard magnetic coating consists of a 40 nm thick cobalt alloy layer deposited on the tip side of the AFM cantilever which leads to a permanent magnetization of the AFM tip with the direction usually along the AFM tip axis. We recommend magnetizing the AFM tip by means of a strong magnet (e.g. a NdFeB magnet, a few millimeters in size) prior to the measurement.
The aluminum reflex coating deposited on the detector side of the AFM cantilever enhances the reflectance of the laser beam and prevents light from interfering within the AFM cantilever.
As the coating is almost stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.
|Order Code||Quantity||Data Sheet|
NanoWorld® Magnetic Force Microscopy (MFM) AFM Probes Screencast
For detailed information about our AFM probe product series please see below: