Type: S-MFMR

Soft Magnetic Coating - Magnetic force microscopy - Reflex coating

Logo
Cantilever Data Value Range*
Resonance Frequency 75 kHz 60 - 90 kHz
Force Constant 2.8 N/m 1.2 - 5.5 N/m
Length 225 µm 220 - 230 µm
Mean Width 28 µm 22.5 - 32.5 µm
Thickness 3 µm 2.5 - 3.5 µm

This AFM probe has alignment grooves on the back side of the support chip.

Point Probe AFM tip

Point Probe AFM tip

Product Description

NanoWorld® Pointprobe® S-MFMR AFM probes are designed for the measurement of magnetic domains in soft magnetic samples. Due to the low coercivity of the soft magnetic AFM tip coating the magnetisation of the AFM tip will easily get reoriented by hard magnetic samples.

All AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. The AFM tip is shaped like a polygon based pyramid with a typical height of 10-15 µm.

Additionally this AFM probe offers unique features:

  • soft magnetic coating on the tip side (coercivity of app. 7.5 Oe, remanence magnetization of app. 225 emu/cm3)
  • effective magnetic moment 0.75x of standard AFM probes
  • AFM tip radius of curvature of the coated AFM tip < 30 nm
  • magnetic resolution better than 35 nm

 

Image A trapezoidal cross section of the AFM cantilever and therefore 30% wider (e.g. NCH) AFM cantilever detector side result in easier and faster laser adjustment. Additionally, because there is simply more space to place and reflect the laser beam, a higher SUM signal is reached.

Tip shape: Standard

Coating: Magnetic

Soft Magnetic Coating / Aluminum Reflex Coating

The soft magnetic coating consists of a thin soft magnetic layer deposited on the tip side of the AFM cantilever. The coercivity is app. 7.5 Oe and the remanence magnetization is app. 225 emu/cm3 (these values were determined on a flat surface). We recommend magnetizing the AFM tip by means of a strong magnet (e.g. a NdFeB magnet, a few millimeters in size) prior to the measurement.

The aluminum reflex coating deposited on the detector side of the AFM cantilever enhances the reflectance of the laser beam and prevents light from interfering within the AFM cantilever. As the coating is almost stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.

Order Codes

Order Code Quantity Data Sheet
S-MFMR-10 10 yes
S-MFMR-20 20 yes
S-MFMR-50 50 no

NanoWorld® Magnetic Force Microscopy (MFM) AFM Probes Screencast

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Bruker® is a trademark of Bruker Corporation

For more information contact: info@nanoworld.com

Pointprobe® is a registered trademark of NanoWorld AG

All data are subject to change without notice.

NanoWorld AG
Rue des Saars 10
CH-2000 Neuchâtel,
Switzerland
www.nanoworld.com

For detailed information about our AFM probe product series please see below: