Soft Magnetic Coating - Magnetic force microscopy - Reflex coating
|Resonance Frequency||75 kHz||60 - 90 kHz|
|Force Constant||2.8 N/m||1.2 - 5.5 N/m|
|Length||225 µm||220 - 230 µm|
|Mean Width||28 µm||22.5 - 32.5 µm|
|Thickness||3 µm||2.5 - 3.5 µm|
This AFM probe has alignment grooves on the back side of the support chip.
Point Probe AFM tip
NanoWorld® Pointprobe® S-MFMR AFM probes are designed for the measurement of magnetic domains in soft magnetic samples. Due to the low coercivity of the soft magnetic tip coating the magnetisation of the tip will easily get reoriented by hard magnetic samples.
All probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. The tip is shaped like a polygon based pyramid with a typical height of 10-15 µm.
Additionally this probe offers unique features:
- soft magnetic coating on the tip side (coercivity of app. 7.5 Oe, remanence magnetization of app. 225 emu/cm3)
- effective magnetic moment 0.75x of standard probes
- tip radius of curvature of the coated tip < 30 nm
- magnetic resolution better than 35 nm
A trapezoidal cross section of the cantilever and therefore 30% wider (e.g. NCH) cantilever detector side result in easier and faster laser adjustment. Additionally, because there is simply more space to place and reflect the laser beam, a higher SUM signal is reached.
Tip shape: Standard
Soft Magnetic Coating / Aluminum Reflex Coating
The soft magnetic coating consists of a thin soft magnetic layer deposited on the tip side of the cantilever. The coercivity is app. 7.5 Oe and the remanence magnetization is app. 225 emu/cm3 (these values were determined on a flat surface). We recommend magnetizing the tip by means of a strong magnet (e.g. a NdFeB magnet, a few millimeters in size) prior to the measurement.
The aluminum reflex coating deposited on the detector side of the cantilever enhances the reflectance of the laser beam and prevents light from interfering within the cantilever. As the coating is almost stress-free the bending of the cantilever due to stress is less than 2 degrees.
NanoWorld® Magnetic Force Microscopy (MFM) AFM Probes Screencast
For detailed information about our AFM probe product series please see below: