How to perform an AFM measurement in magnetic lift mode on Bruker® AFM systems with Nanoscope® software, using S-MFMR AFM tips - NanoWorld®

Pointprobe® AFM tip sideview image

This is a how-to-use step-by-step instruction on how to set up and scan in magnetic lift mode using the respective NanoWorld® AFM probe.

This instruction is valid for the following NanoWorld® magnetic lift mode AFM probes:

  • MFMR
  • S-MFMR
  1. Steps

  2. Step 1 - mount AFM probe and select AFM Experiment

    • Mount EFM probe into AFM probe holder
    • In Choose an Experiment Category: select Electrical & Magnetic
    • In Select Experiment Group: select Electrical & Magnetic Lift Modes
    • In Select Experiment: select MFM & EFM Phase & Frequency
  3. Step 2 - select AFM probe

    • In MFM & EFM Phase & Frequency select Setup
    • In Probe I'll be using select New Probe of type
    • From dropdown menu select MESP
  4. Step 3 - adjust laser and tune AFM cantilever

    • In MFM & EFM Phase & Frequency select Setup
    • Adjust laser on AFM cantilever
    • Adjust laser on detector Maximize SUM signal
    • Tune AFM cantilever
  5. Step 4 - focus on sample / AFM tip reflection

    • In MFM & EFM Phase & Frequency select Navigate
    • In Focus Sample: select Sample (default) or Tip Reflection
    • Focus on sample, respectively on AFM tip reflection, by moving the scan head up or down
  6. Step 5 - set scan size and engage AFM probe

    • In MFM & EFM Phase & Frequency select Check Parameters
    • Adjust Scan Size
    • Select Engage
  7. Step 6 - scan sample, check and adjust scan parameters

    • Scan the sample
    • Check and adjust Scan Size if needed
    • Check and adjust Scan Rate (i.e. scan speed) if needed
    • Check and adjust Integral Gain and Proportional Gain if needed

How to optimize your scan parameters? Click HERE for more information!

Bruker® and Nanoscope® are trademarks of Bruker Corporation

For detailed information about our AFM probe product series please see below: