Type: AR5-NCLR

High Aspect Ratio (> 5:1) - Non-contact/Tapping™ mode - Long AFM Cantilever - Reflex coating

Cantilever Data Value Range*
Resonance Frequency 190 kHz 160 - 210 kHz
Force Constant 48 N/m 31 - 71 N/m
Length 225 µm 220 - 230 µm
Mean Width 38 µm 33 - 43 µm
Thickness 7 µm 6.5 - 7.5 µm

This AFM probe has alignment grooves on the back side of the support chip.

High Aspect Ratio Tip (AR5)

High Aspect Ratio Tip (AR5)

Product Description

NanoWorld® Pointprobe® NCL probes are designed for non-contact or tapping mode imaging and offer an alternative to our high frequency non-contact type NCH. The NCL type is recommended if the feedback loop of the microscope does not accept high frequencies or if the detection system needs a minimum AFM cantilever length (> 125 µm). This AFM probe combines high operation stability with outstanding sensitivity. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid with a typical height of 10 - 15 µm.

For measurements on samples with sidewall angles approaching 90° we offer specially tailored AFM tips showing a high aspect ratio portion with near-vertical sidewalls.

These AFM probes offer unique features:

  • length of the high aspect ratio portion of the AFM tip > 2 µm
  • typical aspect ratio of this portion in the order of 7:1
    (when viewed from side as well as along AFM cantilever axis)
  • half cone angle of the high aspect ratio portion typically < 5°
  • excellent AFM tip radius of curvature

For applications allowing higher resonance frequencies or a shorter AFM cantilever length we recommend our Pointprobe® type AR5-NCHR.

Image A trapezoidal cross section of the AFM cantilever and therefore 30% wider (e.g. NCH) AFM cantilever detector side result in easier and faster laser adjustment. Additionally, because there is simply more space to place and reflect the laser beam, a higher SUM signal is reached.

Tip shape: High-Aspect-Ratio

Coating: Reflective Aluminum

Aluminum Reflex Coating

The aluminum reflex coating consists of a 30 nm thick aluminum layer deposited on the detector side of the AFM cantilever which enhances the reflectance of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the AFM cantilever.

Order Codes

Order Code Quantity Data Sheet
AR5-NCLR-10 10 yes
AR5-NCLR-20 20 yes
AR5-NCLR-50 50 no
AR5-NCLR-W 380 yes

NanoWorld® Pointprobe® High Aspect Ratio AFM Tip (AR5 / AR5T) Screencast

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Bruker® is a trademark of Bruker Corporation

For more information contact: info@nanoworld.com

Pointprobe® is a registered trademark of NanoWorld AG

All data are subject to change without notice.

NanoWorld AG
Rue des Saars 10
CH-2000 Neuchâtel,

For detailed information about our AFM probe product series please see below: