Tilt compensated High Aspect Ratio (> 5:1) - Non-contact/Tapping™ mode - High resonance frequency - Reflex coating
|Resonance Frequency||330 kHz||250 - 390 kHz|
|Force Constant||42 N/m||21 - 78 N/m|
|Length||125 µm||120 - 130 µm|
|Mean Width||30 µm||25 - 35 µm|
|Thickness||4 µm||3.5 - 4.5 µm|
This AFM probe has alignment grooves on the back side of the support chip.
Tilt compensated High Aspect Ratio Tip (AR5T)
NanoWorld® Pointprobe® NCH probes are designed for non-contact or tapping mode imaging. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability.
All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a typical height of 10 - 15 µm.
These probes offer unique features:
- Tilted 13° to the center axis of the tip
- Length of the high aspect ratio portion of the tip > 2 µm
- Typical aspect ratio of this portion in the order of 7:1
(when viewed from side as well as along cantilever axis!)
- Half cone angle of the high aspect ratio portion typically < 5°
- Typical tip radius of curvature < 10 nm
A trapezoidal cross section of the cantilever and therefore 30% wider (e.g. NCH) cantilever detector side result in easier and faster laser adjustment. Additionally, because there is simply more space to place and reflect the laser beam, a higher SUM signal is reached.
Tip shape: High-Aspect-Ratio
Aluminum Reflex Coating
The aluminum reflex coating consists of a 30 nm thick aluminum layer deposited on the detector side of the cantilever which enhances the reflectance of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the cantilever.
|Order Code||Quantity||Data Sheet|
NanoWorld® Pointprobe® High Aspect Ratio Tip (AR5 / AR5T) Screencast
For detailed information about our AFM probe product series please see below: