Tilt compensated High Aspect Ratio (> 5:1) - Non-contact/Tapping™ mode - High resonance frequency - Reflex coating

Cantilever Data Value Range*
Resonance Frequency 330 kHz 250 - 390 kHz
Force Constant 42 N/m 21 - 78 N/m
Length 125 µm 120 - 130 µm
Mean Width 30 µm 25 - 35 µm
Thickness 4 µm 3.5 - 4.5 µm

This AFM probe has alignment grooves on the back side of the support chip.

Tilt compensated High Aspect Ratio Tip (AR5T)

Tilt compensated High Aspect Ratio Tip (AR5T)

Product Description

NanoWorld® Pointprobe® NCH probes are designed for non-contact or tapping mode imaging. This AFM probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid with a typical height of 10 - 15 µm.

For measurements on samples with sidewall angles approaching 90° we offer specially tailored AFM tips showing a high aspect ratio portion with near-vertical sidewalls.

These AFM probes offer unique features:

  • Tilted 13° to the center axis of the AFM tip
  • Length of the high aspect ratio portion of the AFM tip > 2 µm
  • Typical aspect ratio of this portion in the order of 7:1
    (when viewed from side as well as along AFM cantilever axis!)
  • Half cone angle of the high aspect ratio portion typically < 5°
  • Typical AFM tip radius of curvature < 10 nm

Image A trapezoidal cross section of the AFM cantilever and therefore 30% wider (e.g. NCH) AFM cantilever detector side result in easier and faster laser adjustment. Additionally, because there is simply more space to place and reflect the laser beam, a higher SUM signal is reached.

Tip shape: High-Aspect-Ratio

Coating: Reflective Aluminum

Aluminum Reflex Coating

The aluminum reflex coating consists of a 30 nm thick aluminum layer deposited on the detector side of the AFM cantilever which enhances the reflectance of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the AFM cantilever.

Order Codes

Order Code Quantity Data Sheet
AR5T-NCHR-10 10 yes
AR5T-NCHR-20 20 yes
AR5T-NCHR-50 50 no
AR5T-NCHR-W 380 yes

NanoWorld® Pointprobe® High Aspect Ratio AFM Tip (AR5 / AR5T) Screencast

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Bruker® is a trademark of Bruker Corporation

For more information contact: info@nanoworld.com

Pointprobe® is a registered trademark of NanoWorld AG

All data are subject to change without notice.

NanoWorld AG
Rue des Saars 10
CH-2000 Neuchâtel,

For detailed information about our AFM probe product series please see below: