Type: AR5-NCHR

High Aspect Ratio (> 5:1) - Non-contact/Tapping™ mode - High resonance frequency - Reflex coating

Cantilever Data Value Range*
Resonance Frequency 320 kHz 250 - 390 kHz
Force Constant 42 N/m 21 - 78 N/m
Length 125 µm 120 - 130 µm
Mean Width 30 µm 25 - 35 µm
Thickness 4 µm 3.5 - 4.5 µm

This AFM probe has alignment grooves on the back side of the support chip.

High Aspect Ratio Tip (AR5)

High Aspect Ratio Tip (AR5)

Product Description

NanoWorld® Pointprobe® NCH probes are designed for non-contact or tapping mode imaging. This AFM probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid with a typical height of 10 - 15 µm.

This AFM tip shows a high aspect ratio portion with near-vertical sidewalls and is specially tailored for measurements on samples with sidewalls approaching 90°.

These probes offer unique features:

  • Length of the high aspect ratio portion of the AFM tip > 2 µm
  • Typical aspect ratio of this portion in the order of 7:1
    (when viewed from side as well as along AFM cantilever axis!)
  • Half cone angle of the high aspect ratio portion typically < 5°
  • Typical AFM tip radius of curvature < 10 nm

For applications requiring lower resonance frequencies or an AFM cantilever length exceeding 125 µm we recommend our Pointprobe® type AR5-NCLR.

Image A trapezoidal cross section of the AFM cantilever and therefore 30% wider (e.g. NCH) AFM cantilever detector side result in easier and faster laser adjustment. Additionally, because there is simply more space to place and reflect the laser beam, a higher SUM signal is reached.

Tip shape: High-Aspect-Ratio

Coating: Reflective Aluminum

Aluminum Reflex Coating

The aluminum reflex coating consists of a 30 nm thick aluminum layer deposited on the detector side of the AFM cantilever which enhances the reflectance of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the AFM cantilever.

Order Codes

Order Code Quantity Data Sheet
AR5-NCHR-10 10 yes
AR5-NCHR-20 20 yes
AR5-NCHR-50 50 no
AR5-NCHR-W 380 yes

NanoWorld® Pointprobe® High Aspect Ratio AFM Tip (AR5 / AR5T) Screencast

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Bruker® is a trademark of Bruker Corporation

For more information contact: info@nanoworld.com

Pointprobe® is a registered trademark of NanoWorld AG

All data are subject to change without notice.

NanoWorld AG
Rue des Saars 10
CH-2000 Neuchâtel,

For detailed information about our AFM probe product series please see below: