High Aspect Ratio (> 10:1) - Non-contact/Tapping™ mode - High resonance frequency - Reflex coating
|Resonance Frequency||320 kHz||250 - 390 kHz|
|Force Constant||42 N/m||21 - 78 N/m|
|Length||125 µm||120 - 130 µm|
|Mean Width||30 µm||25 - 35 µm|
|Thickness||4 µm||3.5 - 4.5 µm|
This AFM probe has alignment grooves on the back side of the support chip.
High Aspect Ratio Tip (AR5)
NanoWorld® Pointprobe® NCH probes are designed for non-contact or tapping mode imaging. This AFM probe type combines high operation stability with outstanding sensitivity and fast scanning ability.
All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid with a typical height of 10 - 15 µm.
For measurements on samples with sidewall angles approaching 90° we offer specially tailored AFM tips showing a high aspect ratio portion with near-vertical sidewalls.
These AFM probes offer unique features:
- length of the high aspect ratio portion of the AFM tip > 1.5 µm
- typical aspect ratio of this portion in the order of 12:1
(when viewed from side as well as along AFM cantilever axis!)
- half cone angle of the high aspect ratio portion typically < 2.8°
- excellent tip radius of curvature.
A trapezoidal cross section of the AFM cantilever and therefore 30% wider (e.g. NCH) AFM cantilever detector side result in easier and faster laser adjustment. Additionally, because there is simply more space to place and reflect the laser beam, a higher SUM signal is reached.
Tip shape: High-Aspect-Ratio
Aluminum Reflex Coating
The aluminum reflex coating consists of a 30 nm thick aluminum layer deposited on the detector side of the AFM cantilever which enhances the reflectance of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the AFM cantilever.
|Order Code||Quantity||Data Sheet|
NanoWorld® Pointprobe® High Aspect Ratio AFM Tip (AR5 / AR5T) Screencast
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Pointprobe® is a registered trademark of NanoWorld AG
All data are subject to change without notice.
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For detailed information about our AFM probe product series please see below: