AR10-NCHR - NanoWorld®

Type: AR10-NCHR

High Aspect Ratio (> 10:1) - Non-contact/Tapping™ mode - High resonance frequency - Reflex coating

Cantilever Data	Value	Range*
Resonance Frequency	320 kHz	250 - 390 kHz
Force Constant	42 N/m	21 - 78 N/m
Length	125 µm	120 - 130 µm
Mean Width	30 µm	25 - 35 µm
Thickness	4 µm	3.5 - 4.5 µm

*Typical values

How to optimize AFM scan parameters

How to use on Bruker® AFM systems

This AFM probe has alignment grooves on the back side of the support chip.

High Aspect Ratio Tip (AR5)

Product Description

NanoWorld® Pointprobe® NCH probes are designed for non-contact or tapping mode imaging. This AFM probe type combines high operation stability with outstanding sensitivity and fast scanning ability.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid with a typical height of 10 - 15 µm.

For measurements on samples with sidewall angles approaching 90° we offer specially tailored AFM tips showing a high aspect ratio portion with near-vertical sidewalls.

These AFM probes offer unique features:

length of the high aspect ratio portion of the AFM tip > 1.5 µm
typical aspect ratio of this portion in the order of 12:1
(when viewed from side as well as along AFM cantilever axis!)
half cone angle of the high aspect ratio portion typically < 2.8°
excellent tip radius of curvature.

A trapezoidal cross section of the AFM cantilever and therefore 30% wider (e.g. NCH) AFM cantilever detector side result in easier and faster laser adjustment. Additionally, because there is simply more space to place and reflect the laser beam, a higher SUM signal is reached.

Tip shape: High-Aspect-Ratio

Coating: Reflective Aluminum

Aluminum Reflex Coating

The aluminum reflex coating consists of a 30 nm thick aluminum layer deposited on the detector side of the AFM cantilever which enhances the reflectance of the laser beam by a factor of 2.5. Furthermore it prevents light from interfering within the AFM cantilever.

Order Codes

Order Code	Quantity	Data Sheet
AR10-NCHR-10	10	yes
AR10-NCHR-20	20	yes
AR10-NCHR-50	50	no
AR10-NCHR-W	380	yes

NanoWorld® Pointprobe® High Aspect Ratio AFM Tip (AR5 / AR5T) Screencast

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Guaranteed values

Bruker® is a trademark of Bruker Corporation

Scientific publications mentioning use of this AFM probe

Tiroli‐Cepeda AO, Linhares LA, Aragão AZ, de Jesus JR, Wasilewska‐Sampaio AP, De Felice FG, Ferreira ST, Borges JC, Cyr DM, Ramos CH
Type I Hsp40s/DnaJs aggregates exhibit features reminiscent of amyloidogenic structures
The FEBS Journal. 2024 Sep;291(17):3904-23
DOI: https://doi.org/10.1111/febs.17215

Rumler M, Foerthner M, Baier L, Evanschitzky P, Becker M, Rommel M, Frey L
Large area manufacturing of plasmonic colour filters using substrate conformal imprint lithography
Nano Futures. 2017 Apr 24;1(1):015002
DOI: https://doi.org/10.1088/2399-1984/aa6560

Shinohara T, Higaki Y, Hoshino T, Masunaga H, Ogawa H, Okamoto Y, Aoki T, Takahara A.
“Buried” nano-structure and molecular aggregation state in ordered heterojunction poly (3-hexylthiophene)-based photovoltaics
Japanese Journal of Applied Physics. 2014 Apr 23;53(5S1):05FH09
DOI: https://doi.org/10.7567/JJAP.53.05FH09

Egashira K, Morita Y, Hattori Y
Electrical discharge machining of submicron holes using ultrasmall-diameter electrodes
Precision engineering. 2010 Jan 1;34(1):139-44
DOI: https://doi.org/10.1016/j.precisioneng.2009.05.007

Yamada K, Umetani M, Tamura T, Tanaka Y, Kasa H, Nishii J
Antireflective structure imprinted on the surface of optical glass by SiC mold
Applied Surface Science. 2009 Jan 15;255(7):4267-70
DOI: https://doi.org/10.1016/j.apsusc.2008.11.020

Qin D, Tan S, Qin S, Ford WT
Monitoring the transformation of colloidal crystals by styrene vapor using atomic force microscopy
Langmuir. 2004 Apr 13;20(8):3145-50
DOI: https://doi.org/10.1021/la030358j

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For more information contact: info@nanoworld.com

Pointprobe® is a registered trademark of NanoWorld AG

All data are subject to change without notice.

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