Type: CONT

Contact Mode

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Cantilever Data Value Range*
Resonance Frequency 13 kHz 9 - 17 kHz
Force Constant 0.2 N/m 0.07 - 0.4 N/m
Length 450 µm 445 - 455 µm
Mean Width 50 µm 45 - 55 µm
Thickness 2 µm 1.5 - 2.5 µm

This AFM probe has alignment grooves on the back side of the support chip.

Point Probe AFM tip

Point Probe AFM tip

Product Description

NanoWorld® Pointprobe® CONT probes are designed for contact mode imaging. Furthermore this probe can be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimised for high sensitivity due to a low force constant.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a typical height of 10 - 15 µm.

Additionally, this probe offers typical tip radius of curvature of less than 8 nm.

Image A trapezoidal cross section of the cantilever and therefore 30% wider (e.g. NCH) cantilever detector side result in easier and faster laser adjustment. Additionally, because there is simply more space to place and reflect the laser beam, a higher SUM signal is reached.

Tip shape: Standard

Coating: none

Order Codes

Order Code Quantity Data Sheet
CONT-10 10 yes
CONT-20 20 yes
CONT-50 50 no
CONT-W 380 yes

NanoWorld® Pointprobe® Silicon AFM Probes Screencast (Standard Tip)

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Guaranteed values

For more information contact: info@nanoworld.com

Pointprobe® is a registered trademark of NanoWorld AG

All data are subject to change without notice.

NanoWorld AG
Rue des Saars 10
CH-2000 Neuchâtel,
Switzerland
www.nanoworld.com

For detailed information about our AFM probe product series please see below: