How to perform an AFM measurement in contact mode on Bruker® AFM systems with Nanoscope® software, using CONT AFM tips - NanoWorld®

Pointprobe® AFM tip sideview image

This is a how-to-use step-by-step instruction on how to set up and scan in contact mode using the respective NanoWorld® AFM probe.

This instruction is valid for the following NanoWorld® contact mode AFM probes:

  • Arrow™ CONT
  • Arrow™ CONTR
  • CONT
  • ESP
  1. Steps

  2. Step 1 - mount AFM probe and select AFM Experiment

    • Mount AFM probe into AFM probe holder
    • In Choose an Experiment Category: select Contact Mode
    • In Select Experiment Group: select Contact Mode in Air
  3. Step 2 - select AFM probe

    • In Contact in Air select Setup 
    • In Probe I'll be using select New Probe of type
    • From dropdown menu select ESP
  4. Step 3 - adjust laser

    • In Contact in Air select Setup
    • Adjust laser on AFM cantilever
    • Adjust laser on detector
    • Maximize SUM signal
  5. Step 4 - focus on sample / AFM tip reflection

    • In Contact in Air select Navigate
    • In Focus Sample: select Sample (default) or Tip Reflection
    • Focus on sample, respectively on AFM tip reflection, by moving the scan head up or down
  6. Step 5 - set scan size and engage AFM probe

    • In Contact in Air select Check Parameters
    • Adjust Scan Size
    • Select Engage
  7. Step 6 - scan sample, check and adjust scan parameters

    • Scan the sample Check and adjust Scan Size if needed
    • Check and adjust Scan Rate (i.e. scan speed) if needed
    • Check and adjust Integral Gain and Proportional Gain if needed

How to optimize your scan parameters? Click HERE for more information!

Bruker® and Nanoscope® are trademarks of Bruker Corporation

For detailed information about our AFM probe product series please see below: