Type: SSS-NCL

SuperSharpSilicon™ - Non-contact / Tapping™ mode - Long AFM Cantilever

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Cantilever Data Value Range*
Resonance Frequency 190 kHz 160 - 210 kHz
Force Constant 48 N/m 31 - 71 N/m
Length 225 µm 220 - 230 µm
Mean Width 38 µm 33 - 43 µm
Thickness 7 µm 6.5 - 7.5 µm

This AFM probe has alignment grooves on the back side of the support chip.

SuperSharpSilicon™ Tip (SSS)

SuperSharpSilicon™ Tip (SSS)

Product Description

NanoWorld® Pointprobe® NCL probes are designed for non-contact or tapping mode imaging and offer an alternative to our high frequency non-contact type NCH. The NCL type is recommended if the feedback loop of the microscope does not accept high frequencies or if the detection system needs a minimum AFM cantilever length (> 125 µm). This AFM probe combines high operation stability with outstanding sensitivity. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid with a typical height of 10 - 15 µm.

For enhanced resolution of nanostructures and microroughness we have developed an advanced tip manufacturing process leading to unrivalled sharpness of the SuperSharpSilicon™ tip.

This AFM probe offers unique features:

  • Typical AFM tip radius of curvature of 2 nm
  • Guaranteed AFM tip radius of curvature 5 nm (yield >80%)
  • Half cone angle < 10° at the last 200 nm of the AFM tip

For applications allowing higher resonance frequencies or a shorter AFM cantilever length we recommend our Pointprobe® type SSS-NCH.

Image A trapezoidal cross section of the AFM cantilever and therefore 30% wider (e.g. NCH) AFM cantilever detector side result in easier and faster laser adjustment. Additionally, because there is simply more space to place and reflect the laser beam, a higher SUM signal is reached.

Tip shape: Supersharp

Coating: none

Order Codes

Order Code Quantity Data Sheet
SSS-NCL-10 10 yes
SSS-NCL-20 20 yes
SSS-NCL-50 50 no

NanoWorld® Pointprobe® SuperSharpSilicon™ AFM Tip (SSS) Screencast

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Bruker® is a trademark of Bruker Corporation

Scientific publications mentioning use of this AFM probe

Sun, Wendong, Jianqiang Qian, Yingzi Li, Yanan Chen, Zhipeng Dou, Rui Lin, Peng Cheng, Xiaodong Gao, Quan Yuan, and Yifan Hu
Enhancing higher-order modal response in multifrequency atomic force microscopy with a coupled cantilever system
Beilstein Journal of Nanotechnology. 2024 Jun 17;15(1):694-703
DOI: https://doi.org/10.3762/bjnano.15.57


Wei, Wenchao, Andrew Plymale, Zihua Zhu, Xiang Ma, Fanghua Liu, and Xiao-Ying Yu
In vivo molecular insights into syntrophic geobacter aggregates
Analytical Chemistry. 2020 Jul 2;92(15):10402-11
DOI: https://doi.org/10.1021/acs.analchem.0c00653


Hua X, Szymanski C, Wang Z, Zhou Y, Ma X, Yu J, Evans J, Orr G, Liu S, Zhu Z, Yu XY
Chemical imaging of molecular changes in a hydrated single cell by dynamic secondary ion mass spectrometry and super-resolution microscopy
Integrative Biology. 2016 May 16;8(5):635-44
DOI: https://doi.org/10.1039/c5ib00308c


Wu, K., P. W. Lucas, A. Gunaratne, L. S. Collado, H. Corke, A. S. Almusallam, and L. A. Thai
Indentation as a potential mechanical test for textural noodle quality
Journal of Food Engineering. 2016 May 1;177:42-9
DOI: https://doi.org/10.1016/j.jfoodeng.2015.12.016


Xin Hua, Craig Szymanski, Zhaoying Wang, Yufan Zhou, Xiang Ma, Jiachao Yu, James Evans, Galya Orr, Songqin Liu, Zihua Zhu, Xiao-Ying Yu
Chemical imaging of molecular changes in a hydrated single cell by dynamic secondary ion mass spectrometry and super-resolution microscopy
Integrative Biology, Volume 8, Issue 5, May 2016, Pages 635–644
DOI: https://doi.org/10.1039/c5ib00308c


Herruzo, Elena T., Alma P. Perrino, and Ricardo Garcia
Fast nanomechanical spectroscopy of soft matter
Nature communications. 2014 Jan 20;5(1):3126
DOI: https://doi.org/10.1038/ncomms4126


Wong, Minhao, Johannes Guenther, Luyi Sun, Janet Blümel, Riichi Nishimura, and Hung‐Jue Sue
Synthesis and fabrication of multifunctional nanocomposites: stable dispersions of nanoparticles tethered with short, dense and polydisperse polymer brushes in poly (methyl methacrylate)
Advanced Functional Materials. 2012 Sep 11;22(17):3614-24
DOI: https://doi.org/10.1002/adfm.201200083


Mileva, Daniela, Qamer Zia, and René Androsch
Tensile properties of random copolymers of propylene with ethylene and 1-butene: effect of crystallinity and crystal habit
Polymer bulletin. 2010 Sep;65(6):623-34
DOI: https://doi.org/10.1007/s00289-010-0274-1


Mileva, Daniela, Qamer Zia, Rene Androsch, Hans-Joachim Radusch, and Stefano Piccarolo
Mesophase formation in poly (propylene-ran-1-butene) by rapid cooling
Polymer. 2009 Nov 3;50(23):5482-9
DOI: https://doi.org/10.1016/j.polymer.2009.09.064


Huang, Qiang-Xian, Ye-Tai Fei, Satoshi Gonda, Ichiko Misumi, Osamu Sato, Taeho Keem, and Tomizo Kurosawa
The interference effect in an optical beam deflection detection system of a dynamic mode AFM
Measurement Science and Technology. 2006 Jun 1;17(6):1417-23
DOI: https://doi.org/10.1088/0957-0233/17/6/020

For more information contact: info@nanoworld.com

Pointprobe® is a registered trademark of NanoWorld AG

All data are subject to change without notice.

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Rue des Saars 10
CH-2000 Neuchâtel,
Switzerland
www.nanoworld.com

For detailed information about our AFM probe product series please see below: