NanoWorld Pointprobe® NCL probes are designed for non-contact or tapping mode imaging and offer an alternative to our high frequency non-contact type NCH. The NCL type is recommended if the feedback loop of the microscope does not accept high frequencies or if the detection system needs a minimum cantilever length (> 125 µm). This probe combines high operation stability with outstanding sensitivity. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced.
All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a typical height of 10 - 15 µm.
For enhanced resolution of nanostructures and microroughness we have developed an advanced tip manufacturing process leading to unrivalled sharpness of the SuperSharpSilicon tip.
This probe offers unique features:
- Typical tip radius of curvature of 2 nm
- Guaranteed tip radius of curvature 5 nm (yield >80%)
- Half cone angle < 10° at the last 200 nm of the tip