SuperSharpSilicon™ - SEIKO INSTRUMENTS microscopes - Non-contact mode - High force constant
|Resonance Frequency||130 kHz||110 - 150 kHz|
|Force Constant||15 N/m||9 - 25 N/m|
|Length||225 µm||220 - 230 µm|
|Mean Width||33 µm||27.5 - 37.5 µm|
|Thickness||5 µm||4.5 - 5.5 µm|
This AFM probe has alignment grooves on the back side of the support chip.
SuperSharpSilicon™ Tip (SSS)
NanoWorld® Pointprobe® SEIHR probes are designed for owners of a Seiko Instruments microscope using the non-contact mode. All AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid with a typical height of 10 - 15 µm.
For enhanced resolution of nanostructures and microroughness we have developed an advanced AFM tip manufacturing process leading to unrivalled sharpness of the SuperSharpSilicon™ tip.
This AFM probe offers unique features:
- Typical AFM tip radius of curvature of 2 nm
- Guaranteed AFM tip radius of curvature 5 nm (yield >80%)
- Half cone angle < 10° at the last 200 nm of the AFM tip
A trapezoidal cross section of the AFM cantilever and therefore 30% wider (e.g. NCH) AFM cantilever detector side result in easier and faster laser adjustment. Additionally, because there is simply more space to place and reflect the laser beam, a higher SUM signal is reached.
Tip shape: Supersharp
NanoWorld® Pointprobe® SuperSharpSilicon™ AFM Tip (SSS) Screencast
For detailed information about our AFM probe product series please see below: