SuperSharpSilicon™ - Non-contact / Tapping™ mode - High resonance frequency
|250 - 390 kHz
|21 - 78 N/m
|120 - 130 µm
|25 - 35 µm
|3.5 - 4.5 µm
This AFM probe has alignment grooves on the back side of the support chip.
SuperSharpSilicon™ Tip (SSS)
NanoWorld® Pointprobe® NCH probes are designed for non-contact or tapping mode imaging. This AFM probe type combines high operation stability with outstanding sensitivity and fast scanning ability.
All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid with a typical height of 10 - 15 µm.
For enhanced resolution of nanostructures and microroughness we have developed an advanced AFM tip manufacturing process leading to unrivalled sharpness of the SuperSharpSilicon™ tip.
This AFM probe offers unique features:
- Typical AFM tip radius of curvature of 2 nm
- Guaranteed AFM tip radius of curvature 5 nm (yield >80%)
- Half cone angle < 10° at the last 200 nm of the AFM tip
For applications requiring lower resonance frequencies or an AFM cantilever length exceeding 125 µm we recommend our Pointprobe® type SSS-NCL.
A trapezoidal cross section of the AFM cantilever and therefore 30% wider (e.g. NCH) AFM cantilever detector side result in easier and faster laser adjustment. Additionally, because there is simply more space to place and reflect the laser beam, a higher SUM signal is reached.
Tip shape: Supersharp
NanoWorld® Pointprobe® SuperSharpSilicon™ AFM Tip (SSS) Screencast
For detailed information about our AFM probe product series please see below: