Type: NCLPt

Non-contact / Tapping™ mode - Long AFM Cantilever - PtIr5 coating

Logo
Cantilever Data Value Range*
Resonance Frequency 190 kHz 160 - 210 kHz
Force Constant 48 N/m 31 - 71 N/m
Length 225 µm 220 - 230 µm
Mean Width 38 µm 33 - 43 µm
Thickness 7 µm 6.5 - 7.5 µm

This AFM probe has alignment grooves on the back side of the support chip.

Point Probe AFM tip

Point Probe AFM tip

Product Description

NanoWorld® Pointprobe® NCL probes are designed for non-contact or tapping mode imaging and offer an alternative to our high frequency non-contact type NCH. The NCL type is recommended if the feedback loop of the microscope does not accept high frequencies or if the detection system needs a minimum AFM cantilever length (> 125 µm). This AFM probe combines high operation stability with outstanding sensitivity. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced.

All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid with a typical height of 10 - 15 µm.

The AFM tip radius of curvature is less than 25 nm.

For applications allowing higher resonance frequencies or a shorter AFM cantilever length we recommend our Pointprobe® type NCHPt.

Image A trapezoidal cross section of the AFM cantilever and therefore 30% wider (e.g. NCH) AFM cantilever detector side result in easier and faster laser adjustment. Additionally, because there is simply more space to place and reflect the laser beam, a higher SUM signal is reached.

Tip shape: Standard

Coating: Electrically Conductive

PtIr5 Coating

The PtIr5 coating consists of a 23 nm thick platinum iridium5 layer deposited on both sides of the AFM cantilever. The AFM tip side coating enhances the conductivity of the AFM tip and allows electrical contacts. The detector side coating enhances the reflectance of the laser beam by a factor of 2 and prevents light from interfering within the AFM cantilever.

The coating process is optimized for stress compensation and wear resistance. Wear at the AFM tip can occur if operating in contact-, friction- or force modulation mode. As the coating is almost stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.

Order Codes

Order Code Quantity Data Sheet
NCLPt-10 10 yes
NCLPt-20 20 yes
NCLPt-50 50 no
NCLPt-W 380 yes

NanoWorld® Platinum / Iridium5 (PtIr5) Coated AFM Tips Screencast

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Bruker® is a trademark of Bruker Corporation

For more information contact: info@nanoworld.com

Pointprobe® is a registered trademark of NanoWorld AG

All data are subject to change without notice.

NanoWorld AG
Rue des Saars 10
CH-2000 Neuchâtel,
Switzerland
www.nanoworld.com

For detailed information about our AFM probe product series please see below: