Type: Arrow™ EFM

Electrostatic Force Microscopy - PtIr5 coating

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Cantilever Data Value Range*
Resonance Frequency 75 kHz 58 - 97 kHz
Force Constant 2.8 N/m 1.4 - 5.8 N/m
Length 240 µm 235 - 245 µm
Mean Width 35 µm 30 - 40 µm
Thickness 3 µm 2.5 - 3.5 µm
ARROW™ AFM tip

ARROW™ AFM tip More images

Product Description

Optimized positioning through maximized tip visibility

NanoWorld® Arrow™ EFM probes are designed for electrostatic force microscopy. The force constant and the special coating of the EFM type are optimised for this type of application. This type of probe yields very high force sensitivity, while simultaneously enabling tapping and lift mode operation.

All SPM and AFM probes of the Arrow™ series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. These probes feature a rectangular cantilever with a triangular free end and a tetrahedral tip with a typical height of 10 - 15 µm.

Additionally, this probe offers a tip radius of curvature of less than 25 nm.

The unique Arrow™ shape with the tip position at the very end of the cantilever allows easy positioning of the tip on the area of interest.

Image A trapezoidal cross section of the cantilever and therefore 30% wider (e.g. NCH) cantilever detector side result in easier and faster laser adjustment. Additionally, because there is simply more space to place and reflect the laser beam, a higher SUM signal is reached.

Tip shape: Arrow

Coating: Electrically Conductive

PtIr5 Coating

The PtIr5 coating consists of a 23 nm thick platinum iridium5 layer deposited on both sides of the cantilever. The tip side coating enhances the conductivity of the tip and allows electrical contacts. The detector side coating enhances the reflectance of the laser beam by a factor of 2 and prevents light from interfering within the cantilever.

The coating process is optimized for stress compensation and wear resistance. Wear at the tip can occur if operating in contact-, friction- or force modulation mode. As the coating is almost stress-free the bending of the cantilever due to stress is less than 2 degrees.

Order Codes

Order Code Quantity Data Sheet
ARROW-EFM-10 10 Nominal values
ARROW-EFM-20 20 Nominal values
ARROW-EFM-50 50 Nominal values
ARROW-EFM-W 380 Nominal values

NanoWorld® Platinum / Iridium5 (PtIr5) Coated AFM Tips Screencast

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Guaranteed values

For more information contact: info@nanoworld.com

Pointprobe® is a registered trademark of NanoWorld AG

All data are subject to change without notice.

NanoWorld AG
Rue des Saars 10
CH-2000 Neuchâtel,
Switzerland
www.nanoworld.com

For detailed information about our AFM probe product series please see below: