Diamond coated tip - Force modulation mode - Reflex coating
|Resonance Frequency||105 kHz||80 - 130 kHz|
|Force Constant||6.2 N/m||3 - 11.4 N/m|
|Length||225 µm||220 - 230 µm|
|Mean Width||27.5 µm||22.5 - 32.5 µm|
|Thickness||3 µm||2.5 - 3.5 µm|
This AFM probe has alignment grooves on the back side of the support chip.
diamond coated tip
NanoWorld® Pointprobe® FM probes are designed for force modulation mode imaging. The force constant of the FM type fills the gap between contact and non-contact probes. Furthermore non-contact or tapping mode imaging is possible with this AFM probe.
All probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a typical height of 10 - 15 µm.
For applications that require hard contact between tip and sample this probe offers a real diamond tip-side coating. This coating features extremely high wear resistance due to the unsurpassed hardness of diamond.
The typical macroscopic tip radius of curvature lies in the range between 100 and 200 nm. Nanoroughnesses in the 10 nm region improve the resolution on flat surfaces.
A trapezoidal cross section of the cantilever and therefore 30% wider (e.g. NCH) cantilever detector side result in easier and faster laser adjustment. Additionally, because there is simply more space to place and reflect the laser beam, a higher SUM signal is reached.
Tip shape: Standard
Diamond Coating / Aluminum Reflex Coating
The diamond coating consists of a 100 nm thick polycrystalline diamond layer deposited on the tip side of the cantilever resulting in an unsurpassed hardness of the tip.
The aluminum reflex coating deposited on the detector side of the cantilever enhances the reflectance of the laser beam and prevents light from interfering within the cantilever.
NanoWorld® Pointprobe® Diamond Coated Tip (DT), Conductive Diamond Coated Tip (CDT) Screencast
For detailed information about our AFM probe product series please see below: