Diamond coated tip - Non-contact / Tapping™ mode - Long Cantilever - Reflex coating
|Resonance Frequency||210 kHz||175 - 245 kHz|
|Force Constant||72 N/m||48 - 105 N/m|
|Length||225 µm||220 - 230 µm|
|Mean Width||37.5 µm||32.5 - 42.5 µm|
|Thickness||7 µm||6.5 - 7.5 µm|
This AFM probe has alignment grooves on the back side of the support chip.
diamond coated tip
NanoWorld® Pointprobe® NCL probes are designed for non-contact or tapping mode imaging and offer an alternative to our high frequency non-contact type NCH. The NCL type is recommended if the feedback loop of the microscope does not accept high frequencies or if the detection system needs a minimum cantilever length (> 125 µm). This probe combines high operation stability with outstanding sensitivity. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced.
All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a typical height of 10 - 15 µm.
For applications that require hard contact between tip and sample this probe offers a real diamond tip-side coating. This coating features extremely high wear resistance due to the unsurpassed hardness of diamond.
The typical macroscopic tip radius of curvature lies in the range between 100 and 200 nm. Nanoroughnesses in the 10 nm regime improve the resolution on flat surfaces.
For applications allowing higher resonance frequencies or a shorter cantilever length we recommend our Pointprobe® type DT-NCHR.
A trapezoidal cross section of the cantilever and therefore 30% wider (e.g. NCH) cantilever detector side result in easier and faster laser adjustment. Additionally, because there is simply more space to place and reflect the laser beam, a higher SUM signal is reached.
Tip shape: Standard
Diamond Coating / Aluminum Reflex Coating
The diamond coating consists of a 100 nm thick polycrystalline diamond layer deposited on the tip side of the cantilever resulting in an unsurpassed hardness of the tip.
The aluminum reflex coating deposited on the detector side of the cantilever enhances the reflectance of the laser beam and prevents light from interfering within the cantilever.
NanoWorld® Pointprobe® Diamond Coated Tip (DT), Conductive Diamond Coated Tip (CDT) Screencast
For detailed information about our AFM probe product series please see below: