Force Modulation Mode
|Resonance Frequency||75 kHz||60 - 90 kHz|
|Force Constant||2.8 N/m||1.2 - 5.5 N/m|
|Length||225 µm||220 - 230 µm|
|Mean Width||28 µm||22.5 - 32.5 µm|
|Thickness||3 µm||2.5 - 3.5 µm|
This AFM probe has alignment grooves on the back side of the support chip.
Point Probe AFM tip
NanoWorld® Pointprobe® FM probes are designed for force modulation mode imaging. The force constant of the FM type fills the gap between contact and non-contact probes. Furthermore non-contact or tapping mode imaging is possible with this AFM probe.
All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid with a typical height of 10 - 15 µm.
Additionally, this probe offers typical tip radius of curvature of less than 8 nm.
A trapezoidal cross section of the cantilever and therefore 30% wider (e.g. NCH) cantilever detector side result in easier and faster laser adjustment. Additionally, because there is simply more space to place and reflect the laser beam, a higher SUM signal is reached.
Tip shape: Standard
NanoWorld® Pointprobe® Silicon AFM Probes Screencast (Standard Tip)
For detailed information about our AFM probe product series please see below: