Force Modulation Mode
|60 - 90 kHz
|1.2 - 5.5 N/m
|220 - 230 µm
|22.5 - 32.5 µm
|2.5 - 3.5 µm
This AFM probe has alignment grooves on the back side of the support chip.
Pointprobe® AFM tip
NanoWorld® Pointprobe® FM probes are designed for force modulation mode imaging.. The force constant of the FM type fills the gap between contact and non-contact probes. Furthermore non-contact or tapping mode imaging is possible with this AFM probe.
All SPM and AFM probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The AFM tip is shaped like a polygon based pyramid with a typical height of 10 - 15 µm.
Additionally, this AFM probe offers typical AFM tip radius of curvature of less than 8 nm.
A trapezoidal cross section of the AFM cantilever and therefore 30% wider (e.g. NCH) AFM cantilever detector side result in easier and faster laser adjustment. Additionally, because there is simply more space to place and reflect the laser beam, a higher SUM signal is reached.
Tip shape: Standard
NanoWorld® Pointprobe® Silicon AFM Probes Screencast (Standard AFM Tip)
For detailed information about our AFM probe product series please see below: