Type: Arrow™ FM

Force Modulation Mode

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Cantilever Data Value Range*
Resonance Frequency 75 kHz 58 - 97 kHz
Force Constant 2.8 N/m 1.4 - 5.8 N/m
Length 240 µm 235 - 245 µm
Mean Width 35 µm 30 - 40 µm
Thickness 3 µm 2.5 - 3.5 µm
ARROW™ AFM tip

ARROW™ AFM tip More images

Product Description

Optimized positioning through maximized tip visibility

NanoWorld® Arrow™ FM probes are designed for Force Modulation Mode imaging. The Force Constant of the FM type fills the gap between Contact and Non-Contact probes. Furthermore Non-Contact / TappingMode™ imaging is possible with this AFM probe.

All SPM and AFM probes of the Arrow™ series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. These probes feature a rectangular cantilever with a triangular free end and a tetrahedral tip with a typical height of 10 - 15 µm.

Additionally, this probe offers a tip radius of curvature of less than 10 nm.

The unique Arrow™ shape with the tip position at the very end of the cantilever allows easy positioning of the tip on the area of interest.

Image A trapezoidal cross section of the cantilever and therefore 30% wider (e.g. NCH) cantilever detector side result in easier and faster laser adjustment. Additionally, because there is simply more space to place and reflect the laser beam, a higher SUM signal is reached.

Tip shape: Arrow

Coating: none

Order Codes

Order Code Quantity Data Sheet
ARROW-FM-10 10 Nominal values
ARROW-FM-20 20 Nominal values
ARROW-FM-50 50 Nominal values
ARROW-FM-W 380 Nominal values

NanoWorld® Arrow™ Silicon AFM Probes Screencast

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Guaranteed values

For more information contact: info@nanoworld.com

Pointprobe® is a registered trademark of NanoWorld AG

All data are subject to change without notice.

NanoWorld AG
Rue des Saars 10
CH-2000 Neuchâtel,
Switzerland
www.nanoworld.com

For detailed information about our AFM probe product series please see below: