General

• SPM and AFM probes for high resolution imaging
• fit to all well-known commercial SPMs and AFMs
• cantilever and tip are supported by a single crystal silicon support chip
• monolithic design of support chip, cantilever and tip

Material Features

• highly doped, single crystal silicon (resistivity 0.01 - 0.025 Ohm•cm)
• no intrinsic stress and absolutely straight cantilevers
• chemically inert silicon for application in fluids or electrochemical cells

Cantilever

• rectangular cantilever with triangular free end
• easy positioning of tip on the area of interest due to the Arrow™ shape
• consistent distance between tip and cantilever end
• trapezoidal cross section with wide detector side for easy laser adjustment

Support Chip

• dimensions of the support chip are very reproducible (3.4 mm x 1.6 mm x 0.3 mm)
• etched corners of the support chip avoid contact between the support chip and the sample

Tip

• tip has a tetrahedral shape and is located at the very end of the cantilever
• tip height 10-15 µm and radius of curvature typically < 10 nm (< 15 nm guaranteed)
• macroscopic half cone angles
    - are 30° to 35° seen along the cantilever axis
    - are 20° to 25° seen from the side