Arrow™ Series AFM Tips - General Description
General
- SPM and AFM probes for high resolution imaging
- fit to all well-known commercial SPMs and AFMs
- cantilever and tip are supported by a single crystal silicon support chip
- monolithic design of support chip, cantilever and tip
Material Features
- highly doped, single crystal silicon (resistivity 0.01 - 0.025 Ohm•cm)
- no intrinsic stress and absolutely straight cantilevers
- chemically inert silicon for application in fluids or electrochemical cells
Cantilever
- rectangular cantilever with triangular free end
- easy positioning of tip on the area of interest due to the Arrow™ shape
- consistent distance between tip and cantilever end
- trapezoidal cross section with wide detector side for easy laser adjustment
Support Chip
- dimensions of the support chip are very reproducible (3.4 mm x 1.6 mm x 0.3 mm)
- etched corners of the support chip avoid contact between the support chip and the sample
Tip
- tip has a tetrahedral shape and is located at the very end of the cantilever
- tip height 10-15 µm and radius of curvature typically < 10 nm (< 15 nm guaranteed)
- macroscopic half cone angles
- are 30° to 35° seen along the cantilever axis
- are 20° to 25° seen from the side
For detailed information about our AFM probe product series please see below: