For measurements on samples with sidewall angles approaching 90°, e.g. deep trench measurements or other semiconductor applications, we offer two different types of high aspect ratio tips showing near-vertical sidewalls
The high aspect ratio tips are fabricated on the base of the well-established Pointprobe® probes. Thus the geometry of holder and cantilever is equal to that of the Pointprobe® probes.
The mechanical properties of the cantilevers are described in the following product descriptions for each High Aspect Ratio Tip probe respectively. The probes’ properties are enhanced by the high aspect ratio tip shape. Continue reading High Aspect Ratio Tip AR10