Meet us at NanoKorea 2024

NanoWorld AG CEO Manfred Detterbeck is attending NANOKOREA 2024, the 22nd International #Nanotech Symposium & Exhibition on nanoscale science and technology , which will be held from July 3-5, 2024 at KINTEX (Korea International Exhibition Center), Goyang-si, Gyeonggi-do, South Korea.  http://www.nanokorea-sympo.or.kr/welcome.php

This year’s main theme is: Invisible Nano Realizes the Future

Will we meet you there too?

NanoWorld AG AFM probes CEO Manfred Detterbeck in front of the Kintex building with the Nano Korea 2024 logo sign showing a big smile and a thumbs-up for the success of this year's conference and exhibition.
Manfred Detterbeck is already looking forward to Nano Korea 2024. See you there!

Highly efficient carbon-dot-based photoinitiating systems for 3D-VAT printing

Known as a rising star among carbon nanomaterials, carbon dots (CDs) have attracted considerable interest in various fields in recent years.*

In the article “Highly efficient carbon dot-based photoinitiating systems for 3D-VAT printing” Dominika Krok, Wiktoria Tomal, Alexander J. Knight, Alexander I. Tartakovskii, Nicholas T. H. Farr, Wiktor Kasprzyk and Joanna Ortyl describe how they synthesized different types of carbon dots (CDs) based on citric acid as a precursor using an efficient procedure to purify these materials from low molecular by-products and fluorophores.*

They introduce three types of CDs: citric acid-based, as well as ammonia- and ethylenediamine-doped CDs, and compare their effectiveness to commercially available graphene-based CDs as an element of two- or three-component photoinitiating systems dedicated for free radical photopolymerization processes.*

This approach led to the development of efficient initiating systems and allowed better understanding of the mechanism according to which CDs performed in these processes. *

As the proof of concept, CDs-based photoinitiating systems were implemented in two types of 3D-VAT printing processes: DLP and DLW printing, to obtain high-resolution, 3D hydrogel materials. *

Dominika Krok et al. believe that the research presented in their article will become the basis for further work on carbon dots in the context of the diverse use of photopolymerization processes and avoid errors affecting the misinterpretation of data. *

The morphology and chemical composition of obtained hydrogel printouts were profoundly characterized via scanning electron microscopy (SEM), atomic force microscopy (AFM), nanoscale Fourier transform infrared spectroscopy (Nano-FTIR), and scattering-type Scanning Near-field Optical Microscopy (s-SNOM). *

The s-SNOM system used to collect the data shown in figure 12 of the article cited below, consisted of an AFM within one arm of an interferometer, and a moveable mirror in the other. *

A conductive platinum-iridium coated NanoWorld ARROW-EFM AFM probe was brought into tapping mode operation upon the sample (tapping frequency 77 kHz, tapping amplitude 71 nm), and illumination from a single-wavelength source outputting at 1490 cm−1 was sent into the interferometer. *

Under focused illumination, the conductive AFM tip acts as an optical antenna and a near field is generated at the AFM tip apex (AFM tip radius around 25 nm). The near field interacts with the sample surface and forms a scattering centre that scatters further incoming photons. *

The scattered photons were collected at the detector and interfered with photons returning from the movable mirror in the reference arm of the interferometer. This reference mirror was oscillated in order to induce side-band frequency mixing in the optical signal power spectrum, and the optical amplitude and phase data were extracted at the third harmonic of the AFM tapping frequency. *

The optical amplitude data were normalised to the maximum recorded value. The optical phase data were left unprocessed, and thus the raw values of the phase data in Fig. 12 (cited below) do not hold physical meaning. Only the contrast between two areas of Fig. 12 should be considered. *

AFM data: AFM topology data were recorded using the same instrument as used for the s-SNOM measurements. Conductive AFM cantilevers (Pt/Ir coated ARROW-EFM AFM probes from NanoWorld) were used, at a tapping frequency of 77 kHz and a tapping amplitude of 71 nm. *

Further surface characterization of the hydrogel samples performed with AFM and s-SNOM techniques revealed that, occasionally, carbon dot particles can be found at or emerging from the surface of the hydrogel.  *

Fig. 12D presents the surface topography of an 8 μm by 6.8 μm region of hydrogel as measured through AFM, which is in keeping with the surface characterization data presented in Fig. 12A–C. It is not obvious from the topography data in Fig. 12D alone which features of the sample surface relate to carbon material. *

However, the carbon dot particles can be identified through the mechanical properties of their surface: Fig. 15E in the cited article presents the AFM phase data from the scan shown in Fig. 12D, with AFM phase being sensitive to various mechanical surface properties of the sample material such as hardness and adhesion. *

A strong phase contrast is observed between the soft hydrogel and the harder carbon dot material, allowing for the identification of a carbon dot particle that is only partially covered by the hydrogel. *

Additionally, Fig. 12F presents s-SNOM optical phase data taken during the scan shown in Fig. 12D, using illumination at 1490 cm−1. s-SNOM measurements are sensitive to optical properties such as refractive index and absorption, and the differences in these properties between the hydrogel and carbon dot materials creates strong contrast in s-SNOM phase data, allowing for further verification of the location of the carbon dot particle. *

Dominika Krok et al. note that often large areas of the hydrogel surface had to be scanned before any carbon dot particles partially above the surface were identified, and that no carbon dot particles were found either entirely or mostly above the surface of the hydrogel. *

It is therefore assumed that the CDs embedded within the 3D-VAT prints do not congregate on the surface of the material but instead are distributed throughout the matrix. *

Fig. 12 from “Highly efficient carbon dot-based photoinitiating systems for 3D-VAT printing” by Dominika Krok et al. (2023):(A) Low magnification secondary electron (SE) image of a 3D-VAT printout taken using an Everhart–Thornley Detector (ETD). (B) High resolution SE image of a 3D-VAT printout taken using a Through Lens Detector (TLD). (C) Backscattered election (BSE) image taken using a concentric backscatter (CBS) detector. (D): AFM height topography of a carbon dot at the surface of a hydrogel sample. (E) AFM mechanical phase data taken simultaneously with the data in (D). AFM phase data is sensitive to a number of surface properties (hardness, adhesion, etc.) and is often difficult to interpret. In this case, we simply note that the AFM phase contrast observed in (E) allows for easy distinction between areas of the hydrogel (high AFM phase) and the carbon dot surface (low AFM phase). (F): s-SNOM phase data taken simultaneously with the data in (D), with incident illumination at 1490 cm−1. The s-SNOM data was demodulated at the 3rd harmonic of the AFM tapping frequency to reduce the influence of background effects. The hydrogel and the carbon dot particle have different optical responses under the incident illumination, and so s-SNOM phase contrast is observed between the different regions of the AFM scan. Corresponding s-SNOM amplitude data is shown in Fig. S22 of the ESI.† The s-SNOM system used to collect the data shown in this figure consisted of an AFM within one arm of an interferometer, and a moveable mirror in the other. * A conductive platinum-iridium coated NanoWorld ARROW-EFM AFM probe was brought into tapping mode operation upon the sample (tapping frequency 77 kHz, tapping amplitude 71 nm), and illumination from a single-wavelength source outputting at 1490 cm−1 was sent into the interferometer. *
Fig. 12 from “Highly efficient carbon dot-based photoinitiating systems for 3D-VAT printing” by Dominika Krok et al. (2023):
(A) Low magnification secondary electron (SE) image of a 3D-VAT printout taken using an Everhart–Thornley Detector (ETD). (B) High resolution SE image of a 3D-VAT printout taken using a Through Lens Detector (TLD). (C) Backscattered election (BSE) image taken using a concentric backscatter (CBS) detector. (D): AFM height topography of a carbon dot at the surface of a hydrogel sample. (E) AFM mechanical phase data taken simultaneously with the data in (D). AFM phase data is sensitive to a number of surface properties (hardness, adhesion, etc.) and is often difficult to interpret. In this case, we simply note that the AFM phase contrast observed in (E) allows for easy distinction between areas of the hydrogel (high AFM phase) and the carbon dot surface (low AFM phase). (F): s-SNOM phase data taken simultaneously with the data in (D), with incident illumination at 1490 cm−1. The s-SNOM data was demodulated at the 3rd harmonic of the AFM tapping frequency to reduce the influence of background effects. The hydrogel and the carbon dot particle have different optical responses under the incident illumination, and so s-SNOM phase contrast is observed between the different regions of the AFM scan. Corresponding s-SNOM amplitude data is shown in Fig. S22 of the ESI.†

*Dominika Krok, Wiktoria Tomal, Alexander J. Knight, Alexander I. Tartakovskii, Nicholas T. H. Farr, Wiktor Kasprzyk and Joanna Ortyl
Highly efficient carbon dot-based photoinitiating systems for 3D-VAT printing
Polymer Chemistry, 2023, 14, 4429-4444
DOI:  https://doi.org/10.1039/D3PY00726J

The article “Highly efficient carbon dot-based photoinitiating systems for 3D-VAT printing” by Dominika Krok, Wiktoria Tomal, Alexander J. Knight, Alexander I. Tartakovskii, Nicholas T. H. Farr, Wiktor Kasprzyk and Joanna Ortyl is licensed under a Creative Commons Attribution 3.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third-party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit https://creativecommons.org/licenses/by/3.0/.

Feasibility of wear reduction for soft nanostructured thin film through enhanced elastic recoverability and contact stress relief

Over several decades many studies on the reduction of wear of mechanical systems have been conducted.
Methods to reduce wear are generally divided into the following categories: applying lubrication, coating with high-hardness materials, and surface texturing. *

Several studies have reported that coatings with higher hardness show more wear than those with lower hardness. From these reports, it is apparent that wear does not depend solely on the hardness of the surface.  Hence, there is a strong motivation for utilizing additional strategies for designing wear-resistive surfaces rather than only enhancing the hardness of the coating. *

In the article “Feasibility of wear reduction for soft nanostructured thin film through enhanced elastic recoverability and contact stress relief” Kuk-Jin Seo, Hyun-Joon Kim and Dae-Eun Kim show, that a soft, thin film comprising randomly aligned carbon nanotubes (CNTs) can reduce surface wear more effectively than a homogeneous thin film because of enhanced elastic recoverability and contact stress relief originating from its mesh structure. *

To investigate the wear characteristics of the mesh structure compared to those of the homogeneous thin film, multi-walled CNTs (MWCNTs) and diamond-like carbon (DLC) thin films were prepared to conduct nanoscale tribological experiments using atomic force microscopy (AFM). The MWCNT thin film showed unmeasurably low wear compared with the DLC thin film under a certain range of normal load. *

To demonstrate the wear reduction mechanism of the MWCNT thin film, its indentation and frictional behaviors were assessed. The indentation behavior of the MWCNT thin film revealed repetitive elastic deformation with a wide strain range and a significantly lower elastic modulus than that of the DLC thin film. The permanent deformation of the MWCNT thin film was observed through frictional experiments under relatively high normal load conditions. *

The presented results are expected to provide insights into the design of highly wear-resistant surfaces using nanostructures. *

The thickness and surface roughness of the MWCNT and DL thin films were measured using Atomic Force Microscopy. *

The force-displacement (F-D) curves were measured on the MWCNT thin film using the AFM to verify the mechanical behavior when indented by the zirconia microspheres that were used for wear and friction experiments. *

The adhesion forces between the thin films and zirconia microspheres were measured by observing the pull-off force of the F-D curve with the AFM. *

The adhesion force was measured using a colloidal AFM probe to aid the analysis of the tribological characteristics of the thin film. *

The pull-off forces for the DL specimens were obtained at 35 different locations with displacements of 50-200 nm. *

Diamond-coated AFM probes (NanoWorld Pointprobe® DT-NCHR ) were used for scanning, while non-coated silicon AFM probes with relatively high and low spring constants (NanoWorld Pointprobe® NCHR and CONTR) were used for the tribological experiments and specimen characterizations. *

Diamond-coated AFM probes (NanoWorld Pointprobe® DT-NCHR ) were used for scanning, while non-coated silicon AFM probes with relatively high and low spring constants (NanoWorld Pointprobe® NCHR and CONTR) were used for the tribological experiments and specimen characterizations.
Figure 6 from “Feasibility of wear reduction for soft nanostructured thin film through enhanced elastic recoverability and contact stress relief” by Kuk-Jin Seo et al.:
AFM images of wear tracks on the MWCNT thin film under test conditions of (a) 2,000 nN and 20,000 cycles, (b) 6,000 nN and 30,000 cycles, (c) 7,000 nN and 30,000 cycles, (d) 9,200 nN and 30,000 cycles, (e) 13,500 nN and 30,000 cycles, and (f) 28,000 nN and 30,000 cycles. Post-processed AFM images that subtracted the original image before each wear test under conditions of (g) 6,000 nN and 30,000 cycles, (h) 7,000 nN and 30,000 cycles, and (i) 28,000 nN and 30,000 cycles

*Kuk-Jin Seo, Hyun-Joon Kim and Dae-Eun Kim
Feasibility of wear reduction for soft nanostructured thin film through enhanced elastic recoverability and contact stress relief
Friction 11(7): 1292-1306 (2023)
DOI: https://doi.org/10.1007/s40544-022-0669-7

Please follow this external link to read the full article: https://rdcu.be/dejTa

The article “Feasibility of wear reduction for soft nanostructured thin film through enhanced elastic recoverability and contact stress relief” by Kuk-Jin Seo, Hyun-Joon Kim and Dae-Eun Kim is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third-party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit https://creativecommons.org/licenses/by/4.0/.