Author: NanoWorld

New Insights in the Ion Beam Sputtering Deposition of ZnO-Fluoropolymer Nanocomposites

Surface modification treatments able to confer antistain/antibacterial properties to natural or synthetic materials are receiving increasing attention among scientists. Ion beam co-sputtering (IBS) of zinc oxide (ZnO) and poly-tetrafluoroethylene (PTFE) targets allows for the preparation of novel multifunctional coatings composed of antimicrobial ZnO nanoparticles (NPs) finely dispersed in an antistain PTFE polymeric matrix.*

In the article “New Insights in the Ion Beam Sputtering Deposition of ZnO-Fluoropolymer Nanocomposites” Maria Chiara Sportelli, Marco Valentini, Rosaria Anna Picca, Antonella Milella, Angelo Nacci, Antonio Valentini and Nicola Cioffi describe the use of X-ray photoelectron spectroscopy (XPS), atomic force microscopy (AFM), and transmission electron microscopy (TEM) for the characterization of the IBS deposited coatings in order to obtain information on the materials’ surface composition, with deep insight into the nanocoatings’ morphology as a function of the ZnONP loadings.*

The AFM micrographs shown in this article were acquired on 150-nm-thick films in dynamic (“tapping”) mode, in air, using NanoWorld Pointprobe® NCL AFM probes.

Figure 2 from “New Insights in the Ion Beam Sputtering Deposition of ZnO-Fluoropolymer Nanocomposites” by Maria Chiara Sportelli et al.: Atomic force microscopy (AFM) micrographs of ZnO-CFx nanocomposites having an inorganic phase volume fraction of φ = 0.05 (a–a’), φ = 0.10 (b–b’), and φ = 0.15 (c–c’). NanoWorld Pointprobe® NCL AFM probes were used.
Figure 2 from “New Insights in the Ion Beam Sputtering Deposition of ZnO-Fluoropolymer Nanocomposites” by Maria Chiara Sportelli et al.: Atomic force microscopy (AFM) micrographs of ZnO-CFx nanocomposites having an inorganic phase volume fraction of φ = 0.05 (a–a’), φ = 0.10 (b–b’), and φ = 0.15 (c–c’).

*Maria Chiara Sportelli, Marco Valentini, Rosaria Anna Picca, Antonella Milella, Angelo Nacci, Antonio Valentini and Nicola Cioffi
New Insights in the Ion Beam Sputtering Deposition of ZnO-Fluoropolymer Nanocomposites
Applied Sciences 2018, 8(1), 77
DOI: 10.3390/app8010077

Please follow this external link for the full article: https://www.mdpi.com/2076-3417/8/1/77/htm

Open Access: The article « New Insights in the Ion Beam Sputtering Deposition of ZnO-Fluoropolymer Nanocomposites » by Maria Chiara Sportelli et al. is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.

Magnetization-polarization cross-control near room temperature in hexaferrite single crystals

In their publication “Magnetization-polarization cross-control near room temperature in hexaferrite single crystals” V. Kocsis, T. Nakajima, M. Matsuda, A. Kikkawa, Y. Kaneko, J. Takashima, K. Kakurai, T. Arima, F. Kagawa, Y. Tokunaga, Y. Tokura and Y. Taguchi report that they have successfully stabilized a simultaneously ferrimagnetic and ferroelectric phase in a Y-type hexaferrite single crystal up to 450 K, and demonstrated the reversal of large non-volatile M by E field close to room temperature. Manipulation of the magnetic domains by E field was directly visualized at room temperature by using magnetic force microscopy.*

NanoWorld MFMR AFM probes with a hard magnetic coating were used for the magnetic force microscopy measurements described in this article.

Figure 5 from “Magnetization-polarization cross-control near room temperature in hexaferrite single crystals” by V. Kocsis et al.: Real-space magnetic force microscopy (MFM) images. The MFM images were taken on the same 10 × 10 μm2 region of a BSCFAO crystal with an ac face (see Supplementary Figs. 3, 9 and 10) at room temperature. Prior to the MFM measurements, the sample was poled to a single-domain ME state using (+E0, +H0) poling fields in a E ⊥ H; E, H ⊥ c configuration. Panel a shows the changes in the magnetic domain pattern caused by two successive applications of the E field with different signs (the initial state is labeled as the 0th). The images include small regions, R1 and R2, where two representative cases of DW motion are observed. Around R1, the negatively magnetized domain (denoted with blue color, MFM phase shift Δφ < 0) expands and shrinks along the c-axis upon the first and second applications of E-field, respectively. On the other hand, around R2, a positively magnetized domain (denoted with red color, Δφ > 0) is pushed into the view area from the upper side along the ab plane. These two cases are further displayed as line profiles of the MFM phase shift (Δφ) data along the b A−A′ and c B−B′ lines. Panels d, e show the schematic illustration of these two cases of domain wall motions for the second E-field switch, respectively. NanoWorld MFMR AFM probes were used for the magnetic force microscopy.
Figure 5 from “Magnetization-polarization cross-control near room temperature in hexaferrite single crystals” by V. Kocsis et al.: Real-space magnetic force microscopy (MFM) images. The MFM images were taken on the same 10 × 10 μm2 region of a BSCFAO crystal with an ac face (see Supplementary Figs. 3, 9 and 10) at room temperature. Prior to the MFM measurements, the sample was poled to a single-domain ME state using (+E0, +H0) poling fields in a E ⊥ H; E, H ⊥ c configuration. Panel a shows the changes in the magnetic domain pattern caused by two successive applications of the E field with different signs (the initial state is labeled as the 0th). The images include small regions, R1 and R2, where two representative cases of DW motion are observed. Around R1, the negatively magnetized domain (denoted with blue color, MFM phase shift Δφ < 0) expands and shrinks along the c-axis upon the first and second applications of E-field, respectively. On the other hand, around R2, a positively magnetized domain (denoted with red color, Δφ > 0) is pushed into the view area from the upper side along the ab plane. These two cases are further displayed as line profiles of the MFM phase shift (Δφ) data along the b A−A′ and c B−B′ lines. Panels d, e show the schematic illustration of these two cases of domain wall motions for the second E-field switch, respectively.

*V. Kocsis, T. Nakajima, M. Matsuda, A. Kikkawa, Y. Kaneko, J. Takashima, K. Kakurai, T. Arima, F. Kagawa, Y. Tokunaga, Y. Tokura, Y. Taguchi
Magnetization-polarization cross-control near room temperature in hexaferrite single crystals
Nature Communications, volume 10, Article number: 1247 (2019)
DOI: https://doi.org/10.1038/s41467-019-09205-x

Please follow this external link to the full article: https://www.nature.com/articles/s41467-019-09205-x

Open Access The article ” Magnetization-polarization cross-control near room temperature in hexaferrite single crystals” by V. Kocsis et al. is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.

NanoWorld™ appoints NanoAndMore Japan as a distributor for Japan

In a further move to extend its worldwide network of distribution partners NanoWorld™ today has appointed the recently founded NanoAndMore Japan KK (NanoAndMore ジャパン ) as a distributor of its line of probes for Atomic Force Microscopy (AFM) and Scanning Probe Microscopy (SPM) in Japan.

NanoAndMore Japan will keep a large stock of NanoWorld AFM probes on site enabling a fast delivery and will sell NanoWorld AFM probes at manufacturer recommended prices.

NanoWorld™ is convinced that this addition to the already existing distribution network will work for the benefit of its customers.

NanoAndMore ジャパン CEO Mr. Nobuhiro Saito has many years of AFM expertise and is looking forward to assisting customers with the selection of the right AFM probes for their various application needs.

Please refer to the contact data below or to our list of distributors on the “how to buy” page on the NanoWorld webpage.

NanoAndMore ジャパン
201 KTT5 Building, 1-1-1 Waseda, Misato-shi
Saitama-ken 341-0018
Japan

Phone: +81 (48) 951-0958

Contact: Mr. Nobuhiro Saito
info@nanoandmore.jp
www.nanoandmore.jp

NanoWorld Ultra-Short-Cantilevers (USC) - AFM tips for video rate atomic force microscopy
NanoWorld Ultra-Short Cantilevers (USC) for High-Speed AFM (HS-AFM)