Tag: AFM探针

Cross-sectional Kelvin probe force microscopy on III–V epitaxial multilayer stacks: challenges and perspectives

The development of photovoltaic (PV) technologies has progressed significantly over the past twenty years as a result of considerable advancements in solar cell device engineering and material science. *

As a consequence, solar cells have turned into complex structures containing numerous layers and interfaces. The capability to conduct local investigations at the nanoscale level that provide information on the electrical properties of materials and along physical interfaces is becoming crucial for solar photovoltaic device efficiency improvement. *

The capability to conduct local investigations at the nanoscale level that provide information on the electrical properties of materials and along physical interfaces is becoming crucial for solar photovoltaic device efficiency improvement. *

Multilayer III–V-based solar cells are complex devices consisting of many layers and interfaces. *

The study and the comprehension of the mechanisms that take place at the interfaces is crucial for efficiency improvement. *

Electrical measurements based on scanning probe microscopy (SPM) allow for the analysis of two-dimensional (2D) features at the surface and along a physical cross section of nanoscale semiconductor structures. *

Among the wide variety of SPM techniques available, Kelvin probe force microscopy (KPFM) is an application of the atomic force microscope (AFM) for the evaluation of the surface potential with nanometric resolution. KPFM is a valuable investigative approach for the study of work functions via the measurement of the contact potential difference VCPD, that is, the difference between the electrostatic potential at the surface of the investigated structure and that of the KPFM probe. *

In the article “Cross-sectional Kelvin probe force microscopy on III–V epitaxial multilayer stacks: challenges and perspectives” Mattia da Lisca, José Alvarez, James P. Connolly, Nicolas Vaissiere, Karim Mekhazni, Jean Decobert and Jean-Paul Kleider apply frequency-modulated Kelvin probe force microscopy (FM-KPFM) under ambient conditions to investigate the capability of this technique for the analysis of an InP/GaInAs(P) multilayer stack. *

KPFM reveals a strong dependence on the local doping concentration, allowing for the detection of the surface potential of layers with a resolution as low as 20 nm. *

The analysis of the surface potential allowed for the identification of space charge regions and, thus, the presence of several junctions along the stack. Furthermore, a contrast enhancement in the surface potential image was observed when KPFM was performed under illumination, which is analysed in terms of the reduction of surface band bending induced by surface defects by photogenerated carrier distributions. The analysis of the KPFM data was assisted by means of theoretical modelling simulating the energy bands profile and KPFM measurements. *

KPFM was performed using a scanning probe microscopy system under ambient conditions and operated in the frequency-modulated KPFM (FM-KPFM) mode using a two-pass scanning mode, where the second pass was performed at a constant distance of 10 nm from the sample surface. *

The FM-KPFM mode was chosen over the amplitude-modulation mode (AM-KPFM) since it is well known that it provides better spatial resolution. In particular, in AM-KPFM the electrical force between the tip and the sample is directly evaluated, whereas in FM-KPFM the gradient of the force is analysed. As a result, FM-KPFM is more sensitive to local tip apex–sample surface interactions; therefore, long-range electrostatic interactions of the cantilever are reduced, as well as the effect of parasitic capacitances. Additionally, in FM-KPFM, surface potential measurements are less dependent on the lift-height tip–sample distance than in AM-KPFM since this mode is less sensitive to static offsets induced by capacitive coupling or crosstalk. *

The laser beam deflection system in the author’s AFM employs a laser wavelength of 1310 nm, which is well below the bandgap of the sample; therefore, the parasitic laser absorption, which may interfere with the KPFM measurement, is reduced to negligible levels. Highly doped NanoWorld n+-Si ARROW-EFM tips (typical AFM tip radius < 25 nm) with a conductive Pt/Ir coating at a typical resonance frequency of 75 kHz were used. *

Figure 4 from “Cross-sectional Kelvin probe force microscopy on III–V epitaxial multilayer stacks: challenges and perspectives” by Mattia da Lisca et al : KPFM measurement under ambient conditions on the surface cross section of the sample under illumination: (a) topography and (b) VCPD image. A vertical coloured bar is included to ease the identification of the different layers. The profile in (c) corresponds to the region identified by the dotted white segments in (b), each point of the profile (vertical) direction being an average of 207 points over a width of 0.7 μm along the x axis. Several regions along the structure have been highlighted using different colours (see text). The black arrow indicates the space charge region at the InP:nid/InP:Zn interface. Highly doped NanoWorld n+-Si ARROW-EFM AFM probes (typical AFM tip radius < 25 nm) with a conductive Pt/Ir coating at a typical resonance frequency of 75 kHz were used.
Figure 4 from “Cross-sectional Kelvin probe force microscopy on III–V epitaxial multilayer stacks: challenges and perspectives” by Mattia da Lisca et al :
KPFM measurement under ambient conditions on the surface cross section of the sample under illumination: (a) topography and (b) VCPD image. A vertical coloured bar is included to ease the identification of the different layers. The profile in (c) corresponds to the region identified by the dotted white segments in (b), each point of the profile (vertical) direction being an average of 207 points over a width of 0.7 μm along the x axis. Several regions along the structure have been highlighted using different colours (see text). The black arrow indicates the space charge region at the InP:nid/InP:Zn interface.

*Mattia da Lisca, José Alvarez, James P. Connolly, Nicolas Vaissiere, Karim Mekhazni, Jean Decobert and  Jean-Paul Kleider
Cross-sectional Kelvin probe force microscopy on III–V epitaxial multilayer stacks: challenges and perspectives
Beilstein Journal of Nanotechnology 2023, 14, 725–737
DOI: https://doi.org/10.3762/bjnano.14.59

The article “Cross-sectional Kelvin probe force microscopy on III–V epitaxial multilayer stacks: challenges and perspectives” by Mattia da Lisca, José Alvarez, James P. Connolly, Nicolas Vaissiere, Karim Mekhazni, Jean Decobert and  Jean-Paul Kleider is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third-party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit https://creativecommons.org/licenses/by/4.0/.

Detecting Early-Stage Cohesion Due to Calcium Silicate Hydration with Rheology and Surface Force Apparatus

Extremely robust cohesion triggered by calcium silicate hydrate (C–S–H) precipitation during cement hardening makes concrete one of the most commonly used man-made materials. *

In the article “Detecting Early-Stage Cohesion Due to Calcium Silicate Hydration with Rheology and Surface Force Apparatus” Teresa Liberto, Andreas Nenning, Maurizio Bellotto, Maria Chiara Dalconi, Dominik Dworschak, Lukas Kalchgruber, Agathe Robisson, Markus Valtiner and Joanna Dziadkowiec present a proof-of-concept study, in which they seek an additional nanoscale understanding of early-stage cohesive forces acting between hydrating model tricalcium silicate (C3S) surfaces by combining rheological and surface force measurements. *

The composition and surface properties of the PLD-deposited calcium silicate films have been analyzed by X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), scanning electron microscopy with energy-dispersive spectroscopy (SEM-EDS), and atomic force microscopy (AFM). *

The calcium silicate surfaces were initially scanned in air. Subsequently, the authors injected about 1 mL of MilliQ water on top of the films so that both the sample and the AFM tip were submersed and followed the evolution of topography within the same region on a surface. The resultant images were processed in AR software by applying a 5 × 5 median filter. Roughness values were reported as root-mean-square (rms) values of the measured surface heights. *

Teresa Liberto et al. further used Atomic Force Microscopy AFM to study the nanoscale details of the film topography. The measurements performed in air revealed that the calcium silicate films are polycrystalline and are composed of uniform-sized nanograins, smaller than 100 nm in diameter (Figure 6A). At larger scan sizes, they also detected a significant amount of much larger, micron-sized particles that contribute to the quite high surface roughness; however, these were mostly located on sample edges, away from the PLD plume center.*

Subsequent AFM measurements in liquid confirmed that the films do not undergo full dissolution in water for several hours, as tested by continuously scanning the surface fully immersed in water as shown in Figure 6B. The rms roughness of the films in air was 1.2 nm (scan size 1 × 1 μm2), and it significantly increased upon exposure to H2O (rms up to 7 nm for a scan size of 1 × 1 μm2; see Figure 6C). *

The authors also detected a significant change in the film topography in water, with nanoparticles becoming less defined on a surface. This indicates that the films reprecipitated or swelled in contact with water, suggesting the gel-like character of the reprecipitated layer.*

However, despite the low thickness of the PLD-deposited films, there was no indication of complete dissolution–reprecipitation of the films: a smooth mica substrate topography that would indicate film dissolution was not exposed and a rough particle-laden surface was preserved throughout the whole measurement in water. In addition, there was no evidence of complete film dissolution in the SFA measurements; dissolution-related reduction in film thickness would have been indicated by the SFA-coupled white-light interferometric fringes. Therefore, the thin films behave as good model systems to study the early dissolution–reprecipitation phase by microscale surface force measurements. *

NanoWorld ARROW-UHFAuD AFM probes were used for the Atomic Force Microscopy.

The findings presented in the article confirm the strong cohesive properties of hydrated calcium silicate surfaces that, based on the authors’ preliminary SFA measurements, are attributed to sharp changes in the surface microstructure. In contact with water, the brittle and rough C3S surfaces with little contact area weather into soft, gel-like C–S–H nanoparticles with a much larger surface area available for forming direct contacts between interacting surfaces. *

Figure 6. Atomic force microscopy topography maps of calcium silicate films in air (A) and in water ((B) sample immersed in H2O for 30 min). The panels below AFM maps show height profiles along the center of each AFM image as marked with a dashed magenta line. Note that the y axis is the same in both panels. (C) Comparison of the root-mean-square (rms) roughness measured in air and in water (over 1.5 h in the same position) for a 1 × 1 μm2 scan size. Each point corresponds to one AFM scan, including the measurement in air. NanoWorld ARROW-UHFAuD AFM probes were used.
Figure 6 from “Detecting Early-Stage Cohesion Due to Calcium Silicate Hydration with Rheology and Surface Force Apparatus “ by Teresa Liberto et al.:
Atomic force microscopy topography maps of calcium silicate films in air (A) and in water ((B) sample immersed in H2O for 30 min). The panels below AFM maps show height profiles along the center of each AFM image as marked with a dashed magenta line. Note that the y axis is the same in both panels. (C) Comparison of the root-mean-square (rms) roughness measured in air and in water (over 1.5 h in the same position) for a 1 × 1 μm2 scan size. Each point corresponds to one AFM scan, including the measurement in air.

*Teresa Liberto, Andreas Nenning, Maurizio Bellotto, Maria Chiara Dalconi, Dominik Dworschak, Lukas Kalchgruber, Agathe Robisson, Markus Valtiner and Joanna Dziadkowiec
Detecting Early-Stage Cohesion Due to Calcium Silicate Hydration with Rheology and Surface Force Apparatus
Langmuir 2022, 38, 48, 14988–15000
DOI: https://doi.org/10.1021/acs.langmuir.2c02783

The article “Detecting Early-Stage Cohesion Due to Calcium Silicate Hydration with Rheology and Surface Force Apparatus” by Teresa Liberto, Andreas Nenning, Maurizio Bellotto, Maria Chiara Dalconi, Dominik Dworschak, Lukas Kalchgruber, Agathe Robisson, Markus Valtiner and Joanna Dziadkowiec is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third-party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit https://creativecommons.org/licenses/by/4.0/.