A reliable replacement of the Olympus®* AC160 –
Optimized Positioning with Maximum AFM Tip Visibility
NanoWorld AG is pleased to introduce the new Arrow-ACR AFM probe, developed to provide research professionals worldwide with a dependable alternative to the discontinued Olympus®* AC160 microcantilever.
The Arrow™ ACR (typical resonance frequency 300 kHz, typical force constant 26 N/m), combines identical mechanical properties as the
Olympus®* AC160 with the well-known Arrow AFM tip and cantilever geometry. Always positioned exactly at the end of the AFM cantilever, this AFM probe offers easy positioning of the AFM tip over the area of interest.
With their moderate stiffness (typical force constant 26 N/m) the Arrow™ ACR probes are particularly suitable for studying relatively soft materials, including various polymers. These AFM probes are designed to perform optimally in non-contact/Tapping™ mode in air, enabling detailed characterization of thin films, coatings, surface roughness, and localized defects.
Users can expect stable operation, high sensitivity and high-speed scanning capabilities, ensuring reproducible data across a wide range of applications.
For researchers seeking a seamless transition from the discontinued
Olympus®* AC160, the NanoWorld® Arrow™ ACR offers a reliable solution backed by NanoWorld’s manufacturing precision and quality control.
A reliable replacement of the Olympus®* AC160 – NanoWorld introduces new Arrow-ACR Silicon AFM probe Optimized Positioning with Maximum AFM Tip Visibility
Long double-stranded (ds) RNA is emerging as a novel alternative to chemical and genetically-modified insect and fungal management strategies. The ability to produce large quantities of dsRNA in either bacterial systems, by in vitro transcription, in cell-free systems or in planta for RNA interference applications has generated significant demand for the development and application of analytical tools for analysis of dsRNA.*
In their article “Analysis of long dsRNA produced in vitro and in vivo using atomic force microscopy in conjunction with ion-pair reverse-phase HPLC” Alison O. Nwokeoji, Sandip Kumar, Peter M. Kilby, David E. Portwood, Jamie K. Hobbs and Mark J. Dickman have utilised atomic force microscopy (AFM) in conjunction with ion-pair reverse-phase high performance liquid chromatography (IP-RP-HPLC) to provide novel insight into dsRNA for RNAi applications.*
The AFM analysis enabled direct structural characterisation of the A-form duplex dsRNA and accurate determination of the dsRNA duplex length.*
The work presented in this study demonstrates the ability of AFM in conjunction with IP RP HPLC to rapidly assess sample heterogeneity and provide important structural information regarding dsRNA.*
For the high resolution images presented in Fig. 1(A, B) and 2(B) in the article NanoWorld Ultra-Short CantileversUSC-F1.2-k0.15 with a High Density Carbon tip (nominal values: tip radius 10 nm, cantilever length 7 μm, stiffness 0.15 N m−1, resonant frequency 1200 kHz in air) were tuned to 600–650 kHz, oscillated at a free amplitude of <30 mV and scanned at a rate of 0.4–1.0 μm s−1,to visualize the dsRNA and dsDNA grooves.*
Fig. 1 A and B from “Analysis of long dsRNA produced in vitro and in vivo using atomic force microscopy in conjunction with ion-pair reverse-phase HPLC” by Alison O. Nwokeoji et al. : Analysis of dsRNA monomers, multimers and higher order assemblies under non-denaturing conditions. Non-denaturing gel electrophoretograms (A) in vivo synthesised dsRNA (521 bp and 698 bp) (B) in vitro synthesised dsRNA (504 bp). Each dsRNA sample was run in duplicate. The proposed dsRNA multimers or higher order assemblies with reduced electrophoretic mobility are highlighted above the corresponding dsRNA main band.
*Alison O. Nwokeoji, Sandip Kumar,Peter M. Kilby, David E. Portwood, Jamie K. Hobbs and Mark J. Dickman Analysis of long dsRNA produced in vitro and in vivo using atomic force microscopy in conjunction with ion-pair reverse-phase HPLC Analyst, 2019,144, 4985 DOI: 10.1039/c9an00954j
Open
Access: The article « Analysis of long dsRNA produced in vitro and in vivo
using atomic force microscopy in conjunction with ion-pair reverse-phase HPLC by Alison O. Nwokeoji, Sandip Kumar,Peter M.
Kilby, David E. Portwood, Jamie K. Hobbs and Mark J. Dickman is licensed under
a Creative Commons Attribution 3.0 International License, which permits use,
sharing, adaptation, distribution and reproduction in any medium or format, as
long as you give appropriate credit to the original author(s) and the source,
provide a link to the Creative Commons license, and indicate if changes were
made. The images or other third party material in this article are included in
the article’s Creative Commons license, unless indicated otherwise in a credit
line to the material. If material is not included in the article’s Creative
Commons license and your intended use is not permitted by statutory regulation
or exceeds the permitted use, you will need to obtain permission directly from
the copyright holder. To view a copy of this license, visit https://creativecommons.org/licenses/by/3.0/.
You’re welcome to visit us @NanoAndMore Japan booth 6A-402 at #JASIS2019 from September 4-6th, 2019 at Makuhari Messe, Japan to learn more about NanoWorld high quality #AFM probes for #AtomicForceMicroscopy and #ScanningProbeMicroscopy
