Tag: surface roughness

New – NanoWorld introduces Arrow-ACR Silicon AFM probe

A reliable replacement of the Olympus®* AC160 –
Optimized Positioning with Maximum AFM Tip Visibility

NanoWorld AG is pleased to introduce the new Arrow-ACR AFM probe, developed to provide research professionals worldwide with a dependable alternative to the discontinued Olympus®* AC160 microcantilever.

The Arrow™ ACR (typical resonance frequency 300 kHz, typical force constant 26 N/m), combines identical mechanical properties as the
Olympus®* AC160 with the well-known Arrow AFM tip and cantilever geometry. Always positioned exactly at the end of the AFM cantilever, this AFM probe offers easy positioning of the AFM tip over the area of interest.

With their moderate stiffness (typical force constant 26 N/m) the Arrow™ ACR probes are particularly suitable for studying relatively soft materials, including various polymers. These AFM probes are designed to perform optimally in non-contact/Tapping™ mode in air, enabling detailed characterization of thin films, coatings, surface roughness, and localized defects.

Users can expect stable operation, high sensitivity and high-speed scanning capabilities, ensuring reproducible data across a wide range of applications.

For researchers seeking a seamless transition from the discontinued
Olympus®* AC160, the NanoWorld® Arrow™ ACR offers a reliable solution backed by NanoWorld’s manufacturing precision and quality control.

Product announcement of new NanoWorld Arrow-ACR AFM probe – replacement for from the discontinued Olympus®* AC160 microcantilever on the top left. NanoWorld logo on the right. SEM image (side view) of an Arrow silicon AFM tip. On the lower right there is a small image of Arrow AFM cantilever and AFM tip.
A reliable replacement of the Olympus®* AC160 – NanoWorld introduces new Arrow-ACR Silicon AFM probe
Optimized Positioning with Maximum AFM Tip Visibility

 

 

 

 

 

 

 

 

*Olympus® is a trademark of Olympus Corporation