We just published our new screencast about NanoWorld AFM Probes Series.
It will give you a quick overview of our 4 AFM Probes Series: Pointprobe, Arrow, Ultra-Short Cantilevers and Pyrex-Nitride Probes.
Tag: AFM Probe
High Aspect Ratio Tip AR10
For measurements on samples with sidewall angles approaching 90°, e.g. deep trench measurements or other semiconductor applications, we offer two different types of high aspect ratio tips showing near-vertical sidewalls
The high aspect ratio tips are fabricated on the base of the well-established Pointprobe® probes. Thus the geometry of holder and cantilever is equal to that of the Pointprobe® probes.
The mechanical properties of the cantilevers are described in the following product descriptions for each High Aspect Ratio Tip probe respectively. The probes’ properties are enhanced by the high aspect ratio tip shape. Continue reading High Aspect Ratio Tip AR10
CTI Project Cantilever-Based-SNOM-PROBE
NanoWorld AG is developping a cantilever-based SNOM probe, which will be produced using microfabrication techniques. This development project is supported by the Commission for technology and innovation (CTI) of the Swiss Federation