The screencast about NanoWorld AFM probes for Magnetic Force Microscopy held by Dr. Marco Becker has just passed the 2000 views mark. Congratulations Marco!
Magnetic Force Microscopy is a type of Atomic Force Microscopy in which a magnetised AFM tip is used to measure magnetic interactions between the tip and the surface of a magnetic sample. These detected interactions are then used to reconstruct the magnetic structure of the sample surface
NanoWorld currently offers two types of MFM tips:
– MFMR – This type of magnetic AFM tip is coated with a hard magnetic coating on the tip side and yields a very high force sensitivity, while simultaneously enabling tapping and lift mode operation.
– S-MFMR – These magnetic AFM tips are coated with a soft magnetic layer on the tip side and are designed for the measurement of magnetic domains in soft magnetic samples.