Visit NanoWorld at the IMRC 2015 this week

You’re cordially invited to visit our booth T5 at the IMRC 2015  in Cancun this week. Mr. Manfred Detterbeck, CEO of NanoWorld, will join us there for the duration of the conference and the exhibition.

Le invitamos a visitar nuestro stand en IMRC 2015 Manfred Detterbeck, director general de NanoWorld, estará con nosotros durante el congreso y la exposition.

Meet the CEO at IMRC 2015
Meet the CEO at IMRC 2015

 

NANOWORLD POINTPROBE® HIGH ASPECT RATIO TIP (AR5 / AR5T) SCREENCAST

Check out our screencast about NanoWorld Pointprobe® High Aspect Ratio (AR5 / AR5T) Tip.

It will give you an overview of our High Aspect Ratio (AR5 / AR5T) tip which has been developed for measurements on samples with sidewall angles approaching 90°, e.g. deep trench measurements or other semiconductor applications.