Magnetic reversal in perpendicularly magnetized antidot arrays with intrinsic and extrinsic defects

Defects can significantly affect performance of nanopatterned magnetic devices, therefore their influence on the material properties has to be understood well before the material is used in technological applications. However, this is experimentally challenging due to the inability of the control of defect characteristics in a reproducible manner.*

In “Magnetic reversal in perpendicularly magnetized antidot arrays with intrinsic and extrinsic defects» Michal Krupinski, Pawel Sobieszczyk, Piotr Zieliński and Marta Marszałek construct a micromagnetic model, which accounts for intrinsic and extrinsic defects associated with the polycrystalline nature of the material and with corrugated edges of nanostructures.*

The findings described in their article show that magnetic properties and domain configuration in nanopatterned systems are strongly determined by the defects, the heterogeneity of the nanostructure sizes and edge corrugations, and that such imperfections play a key role in the processes of magnetic reversal.*

The magnetic imaging described in the article cited above was performed using NanoWorld MFMR AFM probes for magnetic force microscopy (MFMR).

Figure 8 from “Magnetic reversal in perpendicularly magnetized antidot arrays with intrinsic and extrinsic defects” by Michal Krupinski et al.:
(a) MFM image for an array with an antidot diameter 182 nm taken in zero field after ac demagnetization. Selected domain walls were marked with a blue line. (b) Simulated MFM image for an antidot diameter of 185 nm corresponding to the magnetic moment configuration depicted in Fig. 6b. The MFM tip distance from the sample surface was 180 nm.
Figure 8 from “Magnetic reversal in perpendicularly magnetized antidot arrays with intrinsic and extrinsic defects” by Michal Krupinski et al.:
(a) MFM image for an array with an antidot diameter 182 nm taken in zero field after ac demagnetization. Selected domain walls were marked with a blue line. (b) Simulated MFM image for an antidot diameter of 185 nm corresponding to the magnetic moment configuration depicted in Fig. 6b. The MFM tip distance from the sample surface was 180 nm.

*Michal Krupinski, Pawel Sobieszczyk, Piotr Zieliński and Marta Marszałek
Magnetic reversal in perpendicularly magnetized antidot arrays with intrinsic and extrinsic defects
Nature Scientific Reports volume 9, Article number: 13276 (2019)
DOI: https://doi.org/10.1038/s41598-019-49869-5

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