NANOWORLD POINTPROBE® HIGH ASPECT RATIO TIP (AR5 / AR5T) SCREENCAST

Check out our screencast about NanoWorld Pointprobe® High Aspect Ratio (AR5 / AR5T) Tip.

It will give you an overview of our High Aspect Ratio (AR5 / AR5T) tip which has been developed for measurements on samples with sidewall angles approaching 90°, e.g. deep trench measurements or other semiconductor applications.

 

NANOWORLD POINTPROBE® SUPERSHARPSILICON™ TIP (SSS) SCREENCAST

Check out our screencast about NanoWorld Pointprobe® SuperSharpSilicon™ (SSS) Tip.

It will give you an overview of our SuperSharpSilicon™ (SSS) tip which has been developed for enhanced resolution of microroughness and nanostructures.

SPECIAL TIP VERSIONS OF NANOWORLD POINTPROBE® SILICON AFM PROBES SCREENCAST

Check out our screencast about the Special Tip versions of our NanoWorld Pointprobe® Silicon AFM Probes Series.

It will give you an overview of 3 special tip versions based on our famous standard Pointprobe® tip:

  • The SuperSharpSiliconTM Tip (SSS) for high resolution imaging
  • The High Aspect Ratio Tip (AR5 / AR5T) for deep trench measurements
  • The wear resistant Diamond Coated Tip (DT) and Conductive Diamond Coated Tip (CDT)